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1
Microelectronics failure analysis : desk reference /

Cover is for reference only
Corporate Authors: ASM International; Electronic Device Failure Analysis Society
Group Author: Gandhi, Tejinder
Published: ASM International,
Publication Dates: [2019]
Call Number: TN407-62/M626/7th ed.
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2
Microelectronics failure analysis desk reference

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Group Author: Ross Richard J
Published: ASM International,
Publication Dates: c2011.
Call Number: TN407-62/M626/6th ed.
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4
Transient-induced latchup in CMOS integrated circuits

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Main Authors: Ker, Ming-Dou
Group Author: Hsu, Sheng-Fu
Published:
Electronic eBook
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5
High-speed VLSI interconnections

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Main Authors: Goel, Ashok K., 1953
Published:
Electronic eBook
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6
Microelectronics failure analysis desk reference

Cover is for reference only
Corporate Authors: Electronic Device Failure Analysis Society. Desk Reference Committee
Published: ASM International,
Publication Dates: c2004.
Call Number: TN407-62/M626/5th.ed.
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7
Microelectronic failure analysis desk reference : 2002 supplement

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Corporate Authors: Electronic Device Failure Analysis Society
Published: ASM International,
Publication Dates: c2002.
Call Number: TN407-6/M626/2002 suppl.
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8
Microelectronic failure analysis desk reference

Cover is for reference only
Group Author: Ross Richard J; Boit Christian; Staab Donald
Published: ASM International,
Publication Dates: 1999.
Call Number: TN407-6/M626/4th.ed.
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9
Materials and processing failures in the electronics and computer industry analysis and prevention

Cover is for reference only
Main Authors: Brar A. S.
Group Author: Narayan P. B.; (Prativdi B.)
Published: ASM International,
Publication Dates: c1993.
Call Number: TN04/B822/
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10
Defects in electronic materials symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.

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Group Author: Stavola Michael; Pearton S. J; Davies Gordon
Published: Materials Research Society,
Publication Dates: c1988.
Call Number: TN04-53/D313/1987/
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