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ASTM Committee E-24 on Fracture Testing
American Society for Testing and Materials.,Committee E-24 on Fracture Testing of Metals
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Colegio 24 hs
Institute of Electrical and Electronics Engineers
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NetLibrary, Inc
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IEEE Electron Devices Society
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Materials science of novel oxide-based electronics symposium held April 24-27, 2000, in San Francisco, California, U.S.A.

Cover is for reference only
Group Author: David S; Ginley D. S
Published: Materials Research Society,
Publication Dates: 2000.
Call Number: TN6-532/M425/2000
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