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1

Cover is for reference only

Machine vision inspection systems. Volume 2, Machine -learning-based approaches/

Corporate Authors: Wiley Online Library (Online service)
Group Author: Malarvel, Muthukumaran; Nayak, Soumya Ranjan, 1984-; Pattnaik, Prasant Kumar, 1969-; Panda, Sury Narayan
Published: Scrivener Publishing,
Publication Dates: 2021.

eBook

2

Cover is for reference only

Machine vision inspection systems. Volume 2, Machine -learning-based approaches/

Corporate Authors: Wiley Online Library (Online service)
Group Author: Malarvel, Muthukumaran; Nayak, Soumya Ranjan, 1984-; Pattnaik, Prasant Kumar, 1969-; Panda, Sury Narayan
Published: Scrivener Publishing,
Publication Dates: 2021.

eBook

3

Cover is for reference only

Proceedings of 2021 48th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE2021) : July 28-30, 2021, virtual, online /

Corporate Authors: Review of Progress in Quantitative Nondestructive Evaluation Online); American Society of Mechanical Engineers. Nondestructive Evaluation, Diagnosis, & Prognosis Division
Published: American Society of Mechanical Engineers,
Publication Dates: [2021]
Call Number: TB302.5-532/R454-1/2021

Book

4

Cover is for reference only

Optical Metrology and Inspection for Industrial Applications VIII : 10-12 October 2021, Nantong, China /

Corporate Authors: Optical Metrology and Inspection for Industrial Applications Nantong, China); SPIE (Society); Zhongguo guang xue xue hui
Group Author: Han, Sen; Ehret, Gerd; Chen, Benyong
Published: SPIE,
Publication Dates: [2021]
Call Number: TB96-532/O626-4/2021

Book

5

Cover is for reference only

Machine vision inspection systems. Volume 2, Machine learning-based approaches /

Group Author: Malarvel, Muthukumaran; Nayak, Soumya Ranjan, 1984-; Panda, Sury Narayan; Pattnaik, Prasant Kumar, 1969-
Published: Wiley-Scrivener,
Publication Dates: 2021.
Call Number: TP391.41/M149-3/v.2

Book

6

Cover is for reference only

Optical Metrology and Inspection for Industrial Applications VII : 11-16 October 2020, Online only, China /

Corporate Authors: Optical Metrology and Inspection for Industrial Applications (Conference) Online only, China); SPIE (Society); Zhongguo guang xue xue hui; Qing hua da xue (Beijing, China)‏; Guo jia zi ran ke xue ji jin wei yuan hui (China)‏; Zhongguo ke xue ji shu xie hui‏
Group Author: Han, Sen; Ehret, Gerd; Chen, Benyong
Published: SPIE,
Publication Dates: [2020]
Call Number: TB96-532/O626-4/2020

Book

7

Cover is for reference only

Machine vision inspection systems/

Corporate Authors: Wiley Online Library (Online service)
Group Author: Malarvel, Muthukumaran; Nayak, Soumya Ranjan, 1984-; Panda, Sury Narayan; Pattnaik, Prasant Kumar, 1969-; Muangnak, Nittaya
Published: Wiley-Scrivener,
Publication Dates: 2020.

eBook

8

Cover is for reference only

Machine vision inspection systems/

Corporate Authors: Wiley Online Library (Online service)
Group Author: Malarvel, Muthukumaran; Nayak, Soumya Ranjan, 1984-; Panda, Sury Narayan; Pattnaik, Prasant Kumar, 1969-; Muangnak, Nittaya
Published: Wiley-Scrivener,
Publication Dates: 2020.

eBook

9

Cover is for reference only

Machine vision inspection systems. Volume 1, Image processing, concepts, methodologies and applications /

Group Author: Malarvel, Muthukumaran; Nayak, Soumya Ranjan, 1984-; Panda, Sury Narayan; Pattnaik, Prasant Kumar, 1969-; Muangnak, Nittaya
Published: Wiley-Scrivener,
Publication Dates: 2020.
Call Number: TP391.41/M149/v.1

Book

10

Cover is for reference only

Robots, drones, UAVs and UGVs for operation and maintenance /

Main Authors: Galar, Diego
Group Author: Kumar, Uday; Seneviratne, Dammika
Published: CRC Press,
Publication Dates: [2020]
Call Number: TH17/G146

Book

11

Cover is for reference only

Optical metrology and inspection for industrial applications VI : 21-23 October 2019, Hangzhou, China /

Corporate Authors: Zhongguo guang xue xue hui; SPIE Society; Qing hua da xue Beijing, China; Zhongguo ke xue ji shu xie hui; Guo jia zi ran ke xue ji jin wei yuan hui China
Group Author: Han, Sen; Yoshizawa, Toru; Zhang, Song; Chen, Benyong
Published: SPIE,
Publication Dates: [2019]
Call Number: TB96-532/O626-4/2019

Book

12

44th Annual Review of Progress in Quantitative Nondestructive Evaluation. Provo, Utah, USA, 16-21 July 2017 /

Cover is for reference only

44th Annual Review of Progress in Quantitative Nondestructive Evaluation. Volume 37 : Provo, Utah, USA, 16-21 July 2017 /

Corporate Authors: Symposium on Quantitative Nondestructive Evaluation Provo, Utah, USA; American Institute of Physics
Group Author: Chimenti, Dale E; Bond, Leonard J
Published: American Institute of Physics,
Publication Dates: 2018.
Call Number: TB302.5-532/R454/2017

Book

13

Cover is for reference only

Computer-aided inspection planning : theory and practice /

Main Authors: Al-Ahmari, Abdulrahman M., 1968
Group Author: Nasr, Emad Abouel; Abdulhameed, Osama
Published: CRC Press, Taylor & Francis Group,
Publication Dates: [2017]
Call Number: TP27/A316

Book

14

Cover is for reference only

Optical metrology and inspection for industrial applications IV : 12-14 October 2016, Beijing, China /

Corporate Authors: Zhongguo guang xue xue hui; SPIE Society
Group Author: Han, Sen; Yoshizawa, Toru; Zhang, Song
Published: SPIE,
Publication Dates: [2016]
Call Number: TB96-532/O626-4/2016

Book

15

Cover is for reference only

43rd Annual Review of Progress in Quantitative Nondestructive Evaluation : Atlanta, Georgia, USA, 17-22 July 2016 /

Corporate Authors: Symposium on Quantitative Nondestructive Evaluation Atlanta, Georgia, USA; American Institute of Physics
Group Author: Chimenti, Dale E; Bond, Leonard J
Published: American Institute of Physics,
Publication Dates: 2016.
Call Number: TB302.5-532/R454/2016

Book

16

Cover is for reference only

Machine vision : automated visual inspection : theory, practice and applications /

Main Authors: Beyerer, Jürgen
Group Author: Puente León, Fernando, 1969; Frese, Christian
Published: Springer,
Publication Dates: [2016]
Call Number: TN27/B573

Book

17

41st Annual Review of Progess in Quantitative Nondestructive Evaluation. Boise, Idaho, 20-25 July 2014 /

Cover is for reference only

41st Annual Review of Progess in Quantitative Nondestructive Evaluation. Volume 34 : Boise, Idaho, 20-25 July 2014 /

Corporate Authors: Symposium on Quantitative Nondestructive Evaluation Boise, Idaho
Group Author: Chimenti, Dale E; Bond, Leonard J
Published: AIP Publishing,
Publication Dates: [2015]
Call Number: TB302.5-532/R454/2014

Book

18

Cover is for reference only

Integrated imaging and vision techniques for industrial inspection : advances and applications /

Group Author: Liu, Zheng Associate professor; Ukida, Hiroyuki, 1969; Ramuhalli, Pradeep; Niel, Kurt S
Published: Springer,
Publication Dates: [2015]
Call Number: TP391.41-05/I611

Book

19

Cover is for reference only

42nd Annual Review of Progress in Quantitative Nondestructive Evaluation : Incorporating the 6th European-American Workshop on Reliability of NDE : Minneapolis, Minnesota, USA, 26-31 July 2015 /

Corporate Authors: Symposium on Quantitative Nondestructive Evaluation Minneapolis, Minnesota, USA; European-American Workshop on Reliability of NDE Minneapolis, Minnesota, USA
Group Author: Chimenti, Dale E; Bond, Leonard J
Published: AIP Publishing,
Publication Dates: [2015]
Call Number: TB302.5-532/R454/2015

Book

20

Cover is for reference only

41st Annual Review of Progress in Quantitative Nondestructive Evaluation : Boise, Idaho, 20-25 July 2014 /

Corporate Authors: Symposium on Quantitative Nondestructive Evaluation Boise, Idaho
Group Author: Chimenti, Dale E; Bond, Leonard J
Published: AIP Publishing,
Publication Dates: [2015]
Call Number: TB302.5-532/R454/2014

Book

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