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ASTM Committee E-24 on Fracture Testing
American Society for Testing and Materials.,Committee E-24 on Fracture Testing of Metals
SpringerLink (Online service)
Colegio 24 hs
Institute of Electrical and Electronics Engineers
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NetLibrary, Inc
ASTM Committee E-9 on Fatigue
IEEE Electron Devices Society
International Navigation Congress,Leningrad
IEEE Computer Society

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Materials Congresses 53 Photonics 14 Semiconductors 14 Testing 13 Optoelectronic devices 12 Polymers 12 more ...
3
Optoelectronic integrated circuits IX 22-24 January 2007, San Jose, California, USA

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Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Eldada Louay A; Lee El-Hang
Published: SPIE,
Publication Dates: c2007.
Call Number: TN491-532/O62/2007
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5
Metamaterials, metadevices, and metasystems 2020 : 24-25 August 2020, Online Only, United States /

Cover is for reference only
Corporate Authors: SPIE Society
Group Author: Engheta, N. Nader; Zheludev, Nikolay I; Noginov, Mikhail A
Published: SPIE,
Publication Dates: [2020]
Call Number: TN82-532/M587/2020
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7
Photodetectors materials and devices VI : 22-24 January, 2001, San Jose, [California] USA

Cover is for reference only
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Razeghi M; Brown Gail J
Published: SPIE,
Publication Dates: c2001.
Call Number: TN215-532/P575/2001
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9
Processing of guided wave optoelectronic materials January 24-25, 1984, Los Angeles, California

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Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holman Robert L; Smyth Donald Morgan 1930-
Published: SPIE--the International Society for Optical Engineering,
Publication Dates: c1984.
Call Number: TN204-53/P963/
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10
NACE International Corrosion Conference and Expo 2019 : Nashville, Tennessee, 24-28 March 2019.

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Corporate Authors: Corrosion Conference and Expo Nashville, Tennessee; NACE International
Published: Curran Associates, Inc.,
Publication Dates: [2019]
Call Number: TB304-532/C825-5/2019
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12
Gallium nitride materials and devices III 21-24 January 2008, San Jose, California, USA

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Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Morkoç Hadis
Published: SPIE,
Publication Dates: c2008.
Call Number: TN304.2-532/G171-3/2008
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