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ASTM Committee E-24 on Fracture Testing
American Society for Testing and Materials.,Committee E-24 on Fracture Testing of Metals
SpringerLink (Online service)
Colegio 24 hs
Institute of Electrical and Electronics Engineers
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NetLibrary, Inc
ASTM Committee E-9 on Fatigue
IEEE Electron Devices Society
International Navigation Congress,Leningrad
IEEE Computer Society

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Mathematical models Congresses 20 Computer simulation 7 Optoelectronic devices 6 Optoelectronics 6 Solid state physics 6 Data processing 5 more ...
1
Solar modeling Seattle, Washington, March 21-24, 1994

Cover is for reference only
Group Author: Balantekin A. B; Bahcall John N
Published: World Scientific,
Publication Dates: c1995.
Call Number: P182-532/S684.1/1994/
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7
Noise and fluctuations in econophysics and finance 24-26 May, 2005, Austin, Texas, USA

Cover is for reference only
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Abbott Derek 1960-
Published: SPIE,
Publication Dates: c2005.
Call Number: O414.2-532/N784/2005
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12
Modeling and simulation of laser systems II proceedings, 23-24 January 1991, Los Angeles, California

Cover is for reference only
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Schnurr Alvin D
Published: The Society,
Publication Dates: 1991.
Call Number: TN241-53/M689/1991/
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14
Physics and simulation of optoelectronic devices XIX 24-27 January 2011, San Francisco, California, United States

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Corporate Authors: SPIE Society
Group Author: Witzigmann Bernd 1969-
Published: SPIE,
Publication Dates: c2011.
Call Number: TN203-532/P578/2011
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