馆藏书目查询系统 - 上海图书馆

1

Cover is for reference only

Precision surface metrology：August 23-24, 1983, San Diego, California

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Wyant James C
Published: SPIE--the International Society for Optical Engineering,
Publication Dates: c1983.
Call Number: TB96-53/P923/

Book

2

Cover is for reference only

Essential manual of 24 hour blood pressure management : from morning to nocturnal hypertension /

Main Authors: Kario, Kazuomi
Published: John Wiley & Sons Inc.,
Publication Dates: 2015.

eBook

3

Cover is for reference only

Burning plasma diagnostics：an international conference, Varenna, Italy, 24-28 September 2007

Corporate Authors: International Conference on Burning Plasma Diagnostics (2007 Varenna, Italy
Group Author: Orsitto Francesco P
Published: American Institute of Physics,
Publication Dates: c2008.
Call Number: O536-532/I613/2007

Book

4

Cover is for reference only

Infrared spaceborne remote sensing VI：22-24 July 1998, San Diego, California

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Andresen Bj鑟rn F; Strojnik Marija
Published: SPIE,
Publication Dates: c1998.
Call Number: TP722.5-532/I43/1998/

Book

5

Cover is for reference only

Optical diagnostics and sensing VII：23-24 January 2007, San Jose, California, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Priezzhev Aleksandr Vasil'evich; Coté Gerard Laurence
Published: SPIE,
Publication Dates: c2007.
Call Number: Q46-532/O626/2007

Book

6

Cover is for reference only

Optical diagnostics and sensing VI：24-25 January 2006, San Jose, California, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Priezzhev Aleksandr Vasil'evich; Cotae Gerard Laurence
Published: SPIE,
Publication Dates: c2006.
Call Number: Q46-532/O626/2006

Book

7

Cover is for reference only

Terahertz emitters, receivers, and applications XI : 24 August - 4 September 2020, Online Only, United States /

Corporate Authors: Terahertz Emitters, Receivers, and Applications Conference‏‏ Online Only, United States; SPIE Society
Group Author: Razeghi, M; Baranov, Alexei N
Published: SPIE,
Publication Dates: [2020]
Call Number: TN015-532/T315-2/2020

Book

8

Cover is for reference only

Infrared remote sensing and instrumentation XXVIII : 24 August - 4 September 2020, Online Only, United States /

Corporate Authors: Infrared Remote Sensing and Instrumentation Conference‏‏ Online Only, United States; SPIE Society
Group Author: Scholl, Marija Strojnik
Published: SPIE,
Publication Dates: [2020]
Call Number: TP722.5-532/I439/2020

Book

9

Cover is for reference only

Remote sensing of clouds and the atmosphere XX : 23-24 September 2015, Toulouse, France /

Corporate Authors: SPIE Society; European Association of Remote Sensing Companies Belgium
Group Author: Comer��n, Adolfo; Weber, K. Konradin; Picard, Richard H. Richard Henry, 1938; Sch?fer, Klaus; Kassianov, Evgueni I
Published: SPIE,
Publication Dates: [2015]
Call Number: P414-532/S253/2015

Book

10

Cover is for reference only

Gravitational wave and particle astrophysics detectors：23-24 June 2004, Glasgow, Scotland, United Kingdom

Corporate Authors: American Astronomical Society; SPIE Digital Library; Society of Photo-Optical Instrumentation Engineers
Group Author: Sanders Gary H; Hough James
Published: SPIE,
Publication Dates: c2004.
Call Number: P142.8-532/G777/2004

Book

11

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Conference on the Use of Digital Computers in Measurement, 24-27 September, 1973.

Corporate Authors: Conference on the Use of Digital Computers in Measurement. University of York; Institution of Electrical Engineers. Science, Education, and Management Division; Institution of Electrical Engineers. Control and Automation Division
Published: [Institution of Electrical Engineers],
Publication Dates: [1973]
Call Number: TM-532/C748-1/1973

Book

12

$Reflection, scattering, and diffraction from surfaces VII : 24 August - 4 September 2020, Online Only, United States /$

Cover is for reference only

Reflection, scattering, and diffraction from surfaces VII : 24 August - 4 September 2020, Online Only, United States /

Corporate Authors: Reflection, Scattering, and Diffraction from Surfaces Conference‏ Online Only, United States; SPIE Society
Group Author: Hanssen, Leonard M
Published: SPIE,
Publication Dates: [2020]
Call Number: O436-532/R332/2020

Book

13

Cover is for reference only

Lidar remote sensing for industry and environment monitoring III：24-25 October, 2002, Hangzhou, Cinha

Corporate Authors: Society of Photo-Optical Instrumentation Engineers; United States. National Aeronautics and Space Administration. Earth Science Technology Office; Guo jia yao gan zhong xin China; Zhongguo hai yang xue hui
Group Author: Itabe Toshikazu; Liu Zhishen; Singh Upendra N
Published: SPIE,
Publication Dates: c2003.
Call Number: X87-532/L712-1/2002

Book

14

Cover is for reference only

Metrology-based control for micro-manufacturing：24-25 January 2001, San Jose, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Tobin Kenneth W.
Published: SPIE,
Publication Dates: c2001.
Call Number: TN405-532/M594/2001

Book

15

Cover is for reference only

Lidar technologies, techniques, and measurements for atmospheric remote sensing X : 22 and 24 September 2014, Amsterdam, Netherlands /

Corporate Authors: SPIE Society
Group Author: Singh, Upendra N; Pappalardo, Gelsomina
Published: SPIE,
Publication Dates: [2014]
Call Number: TP722.4-532/L712/2014

Book

16

Cover is for reference only

Three-dimensional imaging, interaction, and measurement：24-27 January 2011, San Francisco, California, United States

Corporate Authors: SPIE Society; Electronic Imaging Science and Technology Symposium (2011 San Francisco, Calif.); IS & T--the Society for Imaging Science and Technology
Group Author: Beraldin Jean Angelo 1960-
Published: SPIE IS&T,
Publication Dates: c2011.
Call Number: TB96-532/T531/2011

Book

17

Cover is for reference only

Metrology, inspection, and process control for microlithography XVII：24-27 February, 2003, Santa Clara, California, USA

Corporate Authors: Semiconductor Equipment and Materials International; International SEMATECH; Society of Photo-Optical Instrumentation Engineers
Group Author: Herr Daniel J. C
Published: SPIE,
Publication Dates: c2003.
Call Number: TN405.7-532/M594/2003/v.1

Book

18

Cover is for reference only

Metrology, inspection, and process control for microlithography XXXIV : 24-27 February 2020, San Jose, California, United States /

Corporate Authors: Metrology, Inspection, and Process Control for Microlithography Conference San Jose, California, United States; SPIE Society
Group Author: Adan, Ofer; Robinson, John C
Published: SPIE,
Publication Dates: [2020]
Call Number: TN405.7-532/M594/2020

Book

19

Cover is for reference only

Metrology Inspection and Process Control for Microlithography XXVIII : 24-27 February 2014, San Jose, California, United States /

Corporate Authors: Metrology Inspection and Process Control for Microlithography San Jose, Calif
Group Author: Cain, Jason P; Sanchez, Martha I
Published: SPIE,
Publication Dates: [2014]
Call Number: TN405.7-532/M594/2014

Book

20

Cover is for reference only

Field measurement and calibration using electrooptical equipment：issues and requirements, August 24-25, 1982, San Diego, California

Corporate Authors: Eglin Air Force Base Fla; Society of Photo-Optical Instrumentation Engineers
Group Author: Zweibaum Frederic; Register Henry
Published: SPIE--the International Society for Optical Engineering,
Publication Dates: c1983.
Call Number: P204-53/F455/

Book

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