Reset Filters
Filter Related Topics: Nanoelectronics AND Semiconductors

Author Results for ２４

ASTM Committee E-24 on Fracture Testing
American Society for Testing and Materials.,Committee E-24 on Fracture Testing of Metals
SpringerLink (Online service)
Colegio 24 hs
Institute of Electrical and Electronics Engineers
see all »
NetLibrary, Inc
ASTM Committee E-9 on Fatigue
IEEE Electron Devices Society
International Navigation Congress,Leningrad
IEEE Computer Society

Filter Related Topics within your search.
1
Advanced etch technology for nanopatterning III : 24-25 February 2014, San Jose, California, United States /

Cover is for reference only
Corporate Authors: SPIE Society
Group Author: Oehrlein, Gottlieb S; Lin, Qinghuang, 1963
Published: SPIE,
Publication Dates: [2014]
Call Number: TB4-532/A244/2014
Book
Save to List
Saved in:
Search Tools: Get RSS Feed — Email this Search —