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42
Fibre Bragg Grating and No-Core Fibre Sensors /

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Main Authors: Daud, Suzairi
Published: Springer,
Publication Dates: [2018]
Call Number: TP212.4/D238
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43
Reflection, scattering, and diffraction from surfaces VI : 20 August 2018, San Diego, California, United States /

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Corporate Authors: SPIE Society
Group Author: Hanssen, Leonard M
Published: SPIE,
Publication Dates: [2018]
Call Number: O436-532/R332/2018
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44
Optical micro- and nanometrology VII : 25-26 April 2018, Strasbourg, France /

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Corporate Authors: SPIE Society
Group Author: Gorecki, Christophe; Asundi, Anand Krishna; Osten, Wolfgang
Published: SPIE,
Publication Dates: [2018]
Call Number: TB96-532/O626/2018
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46
Applied optical metrology II : 8-9 August 2017, San Diego, California, United States /

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Corporate Authors: SPIE Society
Group Author: Novak, Erik L. Erik Lowell, 1971; Trolinger, Jim
Published: SPIE,
Publication Dates: [2017]
Call Number: TB96-532/A652-1/2017
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47
Optical sensing and measurement /

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Group Author: 徐强
Published: 西安电子科技大学出版社,
Publication Dates: 2017.
Call Number: TP212.4/O626
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48
Polarization science and remote sensing VIII : 8-9 August 2017, San Diego, California, United States /

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Corporate Authors: SPIE Society
Group Author: Shaw, Joseph A; Snik, Frans
Published: SPIE,
Publication Dates: [2017]
Call Number: O436.3-532/P762-1/2017
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49
Advances in metrology for X-ray and EUV optics VII : 6-7 August 2017, San Diego, California, United States /

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Corporate Authors: SPIE Society
Group Author: Assoufid, Lahsen; Ohashi, Haruhiko; Asundi, Anand
Published: SPIE,
Publication Dates: [2017]
Call Number: TB96-532/A244-1/2017
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53
Dimensional optical metrology and inspection for practical applications V : 20 April 2016, Baltimore, Maryland, United States /

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Corporate Authors: SPIE Society
Group Author: Harding, Kevin G; Zhang, Song
Published: SPIE,
Publication Dates: [2016]
Call Number: TB96-532/D582/2016
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54
Introduction to nonimaging optics /

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Main Authors: Chaves, Julio
Published: CRC Press,
Publication Dates: [2016]
Call Number: TN247/C512/2nd ed.
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55
Optical measurement technology and instrumentation : 9-11 May 2016, Beijing, China /

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Corporate Authors: SPIE Society
Group Author: Han, Sen; Tan, J. Jiubin
Published: SPIE,
Publication Dates: [2016]
Call Number: TH74-532/O626-4/2016
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56
Optical micro- and nanometrology VI : 5-7 April 2016, Brussels, Belgium /

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Corporate Authors: SPIE Society
Group Author: Gorecki, Christophe; Asundi, Anand Krishna; Osten, Wolfgang
Published: SPIE,
Publication Dates: [2016]
Call Number: TB96-532/O626/2016
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57
Introduction to optical metrology /

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Main Authors: Sirohi, R. S
Published: CRC Press, Taylor & Francis Group,
Publication Dates: [2016]
Call Number: TB96/S621
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