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161

Cover is for reference only

IUTAM Symposium on Advanced Optical Methods and Applications in Solid Mechanics：proceedings of the IUTAM symposium, held in Futuroscope, Poitiers, France, August 31st-September 4th 1998

Corporate Authors: IUTAM Symposium on Advanced Optical Methods and Applications in Solid Mechanics (1998 Poitiers, France; IUTAM Symposium on Advanced Optical Methods and Applications in Solid Mechanics (1998 Poitiers, France)
Group Author: Lagarde Alexis
Published: Kluwer Academic Publishers,
Publication Dates: c2000.
Call Number: TB301-532/I618/1998

Book

162

Cover is for reference only

Optical measurement and nondestructive testing：techniques and applications : 8-10 November 2000, Beijing, China

Corporate Authors: Zhongguo wu li xue hui; Society of Photo-Optical Instrumentation Engineers; China Optics & Optoelectronic Manufacturers Association
Group Author: Song FeiJun
Published: SPIE,
Publication Dates: c2000.
Call Number: TH74-532/O626/2000

Book

163

Cover is for reference only

Optical measurement and nondestructive testing：techniques and applications : 8-10 November 2000, Beijing, China

Corporate Authors: Zhongguo wu li xue hui; Society of Photo-Optical Instrumentation Engineers; China Optics & Optoelectronic Manufacturers Association
Group Author: Song FeiJun
Published: SPIE,
Publication Dates: c2000.
Call Number: TB302.5-532/O626/2000

Book

164

Cover is for reference only

Applied optical measurements

Group Author: Lehner Markus 1967-; Mewes Dieter 1940-
Published: Springer,
Publication Dates: c1999.
Call Number: TK12-33/A652

Book

165

Cover is for reference only

Optical methods of measurement：wholefield techniques

Main Authors: Sirohi R. S
Group Author: Chau F. S
Published: Marcel Dekker,
Publication Dates: 1999.
Call Number: TB133/S621/

Book

166

Cover is for reference only

Optical diagnostics for fluids/heat/combustion and photomechanics for solids：21-23 July 1999, Denver, Colorado

Corporate Authors: Visualization Society of Japan; Institution of Mechanical Engineers Great Britain; Society of Photo-Optical Instrumentation Engineers
Group Author: Bryanston-Cross Peter J; Mercer Carolyn R; Cha Soyoung S
Published: SPIE,
Publication Dates: c1999.
Call Number: O439-532/O62.5/1999/

Book

167

Cover is for reference only

X-ray optics design, performance, and applications：20-21 July 1999, Denver, Colorado

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Khounsary Ali M.
Published: SPIE,
Publication Dates: c1999.
Call Number: O434.1-532/X1/1999/

Book

168

Cover is for reference only

Machine vision systems for inspection and metrology VIII：21-22 September 1999, Boston, Massachusetts

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Solomon Susan Snell; Batchelor Bruce G; Miller John W. V
Published: SPIE,
Publication Dates: c1999.
Call Number: TP391.4-532/M149/1999/

Book

169

Cover is for reference only

Flat panel display technology and display metrology：27-29 January 1999, San Jose, California

Corporate Authors: IS & T--the Society for Imaging Science and Technology; Society of Photo-Optical Instrumentation Engineers
Group Author: Kelley Edward F; Gnade Bruce
Published: SPIE,
Publication Dates: c1999.
Call Number: TN873-532/F586/1999/

Book

170

Cover is for reference only

Optical diagnostic methods for inorganic transmissive materials：20-21 July 1998, San Diego, California

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Hanssen Leonard Matheus, 1953-; Datla Raju Umapathi.
Published: SPIE,
Publication Dates: c1998.
Call Number: TB321.03-532/O62/1998/

Book

171

Cover is for reference only

Recent developments in optical gauge block metrology：20-21 July 1998, San Diego, California

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Brown Nicholas; Decker Jennifer E
Published: SPIE,
Publication Dates: c1998.
Call Number: TB96-532/R295/1998/

Book

172

Cover is for reference only

Optoelectronic metrology：28-30 September, 1998, Łańcut, Poland

Corporate Authors: Poland. Central Office of Measures; Foundation for Industrial and Environmental Science Rzeszów, Poland; Komitet Badań Naukowych Poland; Society of Photo-Optical Instrumentation Engineers; Society of Photo-optical Instrumentation Engineers. Poland Chapter; Institute of Optoelectronics Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego
Group Author: Wie̜cek Tomasz; Owsik Jan
Published: SPIE,
Publication Dates: c1998.
Call Number: TN206-532/O62/1998/

Book

173

Cover is for reference only

Machine vision systems for inspection and metrology VII：4-5 November, 1998, Boston, Massachusetts

Corporate Authors: Machine Vision Association of SME; Society of Photo-Optical Instrumentation Engineers
Group Author: Miller John W. V; Solomon Susan Snell; Batchelor Bruce G
Published: SPIE,
Publication Dates: c1998.
Call Number: TP391.4-532/M149/1998/

Book

174

Cover is for reference only

Optical technology in fluid, thermal, and combustion flow III：28-31 July 1997, San Diego, California

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Trolinger Jim; Kawahashi Masaaki; Cha Soyoung S
Published: SPIE,
Publication Dates: c1997.
Call Number: O439-53/O62.3/1997/

Book

175

Cover is for reference only

Videometrics V, 30-31 July, 1997, San Diego, California

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: El-Hakim Sabry F
Published: SPIE,
Publication Dates: c1997.
Call Number: TP391.4-532/V652/1997/

Book

176

Cover is for reference only

Optical inspection and micromeasurements II：16-19 June 1997, Munich, FRG

Corporate Authors: Society of Photo-Optical Instrumentation Engineers; Commission of the European Communities. Directorate-General for Science, Research, and Development; European Optical Society
Group Author: Gorecki Christophe
Published: SPIE,
Publication Dates: c1997.
Call Number: TB133-532/O62.1/1997/

Book

177

Cover is for reference only

Photometric engineering of sources and systems：29-30 July 1997, San Diego, California

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Arecchi Angelo V
Published: SPIE,
Publication Dates: c1997.
Call Number: O432-532/P575/1997/

Book

178

Cover is for reference only

Three-dimensional and unconventional imaging for industrial inspection and metrology：23-25 October 1995, Philadelphia, Pennsylvania

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Harding Kevin G; Svetkoff Donald J; Descour Michael R
Published: SPIE,
Publication Dates: c1996.
Call Number: TB133-532/T531/1995/

Book

179

Cover is for reference only

Optical inspection and micromeasurements：10-14 June 1996, Besancon, France

Corporate Authors: Centre national de la recherche scientifique France
Group Author: Gorecki Christophe
Published: SPIE--International Society for Optical Engineering,
Publication Dates: c1996.
Call Number: TB133-532/O62.1/1996/

Book

180

Cover is for reference only

Optical metrology

Main Authors: Gasvik Kjell J
Published: J. Wiley,
Publication Dates: c1995.
Call Number: O432.2/G257/2nd ed./

Book

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