馆藏书目查询系统 - 上海图书馆

1

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Development and application of light-field cameras in fluid measurements /

Group Author: Shi, Shengxian; New, T. H.
Published: Springer,
Publication Dates: [2023]
Call Number: O432.2/D489

Book

2

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Dimensional Optical Metrology and Inspection for Practical Applications XI : 3-7 April 2022, Orlando, Florida, United States, 6-12 June 2022, online /

Corporate Authors: Dimensional Optical Metrology and Inspection for Practical Applications (Conference) Orlando, Florida, United States); SPIE (Society)
Group Author: Harding, Kevin G.; Zhang, Song; Hyun, Jae-Sang; Li, Beiwen
Published: SPIE,
Publication Dates: [2022]
Call Number: TB96-532/D582/2022

Book

3

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Optics and Photonics for Advanced Dimensional Metrology II : 5-7 April 2022, Strasbourg, France ; 9-20 May 2022, Online /

Corporate Authors: Optics and Photonics for Advanced Dimensional Metrology Strasbourg, France ; Online); SPIE (Society)
Group Author: Groot, Peter J. de; Leach, Richard; Picart, Pascal
Published: SPIE,
Publication Dates: [2022]
Call Number: TB96-532/O627-2/2022

Book

4

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Real-time Measurements, Rogue Phenomena, and Single-Shot Applications VII : 22-27 January 2022, San Francisco, California, United States ; 20-24 February 2022, Online /

Corporate Authors: Real-time Measurements, Rogue Phenomena, and Single-shot Applications San Francisco, California, United States ; Online); SPIE (Society)
Group Author: Solli, Daniel R.; Herink, Georg; Bielawski, Serge
Published: SPIE,
Publication Dates: [2022]
Call Number: N2-532/R288-1/2022

Book

5

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Applied optical metrology IV : 1-5 August 2021, San Diego, California, United States /

Corporate Authors: Applied Optical Metrology (Conference) San Diego, California, United States); SPIE (Society)
Group Author: Novak, Erik L. (Erik Lowell), 1971-; Trolinger, James D.; Wilcox, Christopher C.
Published: SPIE,
Publication Dates: [2021]
Call Number: TB96-532/A652-1/2021

Book

6

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Modeling aspects in optical metrology VIII : 21-25 June 2021, online only, Germany /

Corporate Authors: Modeling Aspects in Optical Metrology (Conference) Online); SPIE (Society)
Group Author: Bodermann, Bernd; Frenner, Karsten
Published: SPIE,
Publication Dates: [2021]
Call Number: O432.2-532/M689/2021

Book

7

Cover is for reference only

Dimensional Optical Metrology and Inspection for Practical Applications X : 12-16 April 2021, Online Only, United States /

Corporate Authors: Dimensional Optical Metrology and Inspection for Practical Applications (Conference) Online Only, United States); SPIE (Society)
Group Author: Harding, Kevin G.; Zhang, Song; Li, Beiwen
Published: SPIE,
Publication Dates: [2021]
Call Number: TB96-532/D582/2021

Book

8

Cover is for reference only

Polarization science and remote sensing X : 1-5 August 2021, San Diego, California, United States /

Corporate Authors: Polarization Science and Remote Sensing (Conference) San Diego, California, United States); SPIE (Society)
Group Author: Kupinski, Meredith K.; Shaw, Joseph A.; Snik, Frans
Published: SPIE,
Publication Dates: [2021]
Call Number: O436.3-532/P762-1/2021

Book

9

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Real-time Photonic Measurements, Data Management, and Processing VI : 10-12 October 2021, Nantong, China /

Corporate Authors: Real-time Photonic Measurements, Data Management, and Processing Nantong, China); SPIE (Society); Zhongguo guang xue xue hui
Group Author: Li, Ming; Jalali, B.; Mohammad Hossein Asghari
Published: SPIE,
Publication Dates: [2021]
Call Number: O43-532/R288/2021

Book

10

Cover is for reference only

Real-time Measurements, Rogue Phenomena, and Single-Shot Applications VI : 6-11 March 2021, Online Only, United States /

Corporate Authors: Real-time Measurements, Rogue Phenomena, and Single-shot Applications Online Only, United States); SPIE (Society)
Group Author: Solli, Daniel R.; Herink, Georg; Bielawski, Serge
Published: SPIE,
Publication Dates: [2021]
Call Number: N2-532/R288-1/2021

Book

11

Cover is for reference only

Tenth International Symposium on Precision Mechanical Measurements : 15-17 October 2021, Qingdao, China /

Corporate Authors: International Symposium on Precision Mechanical Measurements Qingdao, China); SPIE (Society)
Group Author: Xia, Haojie; Yang, Lian X.; Yu, Liandong
Published: SPIE,
Publication Dates: [2021]
Call Number: O432.2-532/I617/2021

Book

12

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Tribute to James C. Wyant : the extraordinaire in optical metrology and optics education : 2-3 August 2021, San Diego, California, United States /

Corporate Authors: Tribute to James C. Wyant: The Extraordinaire in Optical Metrology and Optics Education (Conference) San Diego, California, United States); SPIE (Society)
Group Author: Mahajan, Virendra N.; Kim, Daewook
Published: SPIE,
Publication Dates: [2021]
Call Number: TB96-532/T822/2021

Book

13

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Optical Metrology and Inspection for Industrial Applications VIII : 10-12 October 2021, Nantong, China /

Corporate Authors: Optical Metrology and Inspection for Industrial Applications Nantong, China); SPIE (Society); Zhongguo guang xue xue hui
Group Author: Han, Sen; Ehret, Gerd; Chen, Benyong
Published: SPIE,
Publication Dates: [2021]
Call Number: TB96-532/O626-4/2021

Book

14

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Optical Metrology and Inspection for Industrial Applications VII : 11-16 October 2020, Online only, China /

Corporate Authors: Optical Metrology and Inspection for Industrial Applications (Conference) Online only, China); SPIE (Society); Zhongguo guang xue xue hui; Qing hua da xue (Beijing, China)‏; Guo jia zi ran ke xue ji jin wei yuan hui (China)‏; Zhongguo ke xue ji shu xie hui‏
Group Author: Han, Sen; Ehret, Gerd; Chen, Benyong
Published: SPIE,
Publication Dates: [2020]
Call Number: TB96-532/O626-4/2020

Book

15

Cover is for reference only

Real-time photonic measurements, data management, and processing V : 11-16 October 2020, Online only, China /

Corporate Authors: Real-time Photonic Measurements, Data Management, and Processing (Conference) Online only, China); Zhongguo guang xue xue hui; SPIE (Society); Qing hua da xue (Beijing, China); Zhongguo ke xue ji shu xie hui.; Guo jia zi ran ke xue ji jin wei yuan hui (China)
Group Author: Li, Ming; Jalali, B.; Mohammad Hossein Asghari
Published: SPIE,
Publication Dates: [2020]
Call Number: O43-532/R288/2020

Book

16

Cover is for reference only

Optics and Photonics for Advanced Dimensional Metrology : 6-10 April 2020, Online Only, France /

Corporate Authors: Optics and Photonics for Advanced Dimensional Metrology Online Only, France; SPIE Society
Group Author: Groot, Peter J. de; Leach, Richard; Picart, Pascal
Published: SPIE,
Publication Dates: [2020]
Call Number: TB96-532/O627-2/2020

Book

17

Cover is for reference only

Advances in metrology for X-ray and EUV optics IX : 24 August - 4 September 2020, Online Only, United States /

Corporate Authors: Advances in Metrology for X-Ray and EUV Optics Conference‏ Online Only, United States; SPIE Society
Group Author: Assoufid, Lahsen; Ohashi, Haruhiko; Asundi, Anand
Published: SPIE,
Publication Dates: [2020]
Call Number: TB96-532/A244-1/2020

Book

18

Cover is for reference only

Optical inspection of microsystems /

Group Author: Osten, Wolfgang
Published: CRC Press, Taylor & Francis Group,
Publication Dates: [2020]
Call Number: TB133/O626/2nd ed.

Book

19

$Reflection, scattering, and diffraction from surfaces VII : 24 August - 4 September 2020, Online Only, United States /$

Cover is for reference only

Reflection, scattering, and diffraction from surfaces VII : 24 August - 4 September 2020, Online Only, United States /

Corporate Authors: Reflection, Scattering, and Diffraction from Surfaces Conference‏ Online Only, United States; SPIE Society
Group Author: Hanssen, Leonard M
Published: SPIE,
Publication Dates: [2020]
Call Number: O436-532/R332/2020

Book

20

Cover is for reference only

Dimensional Optical Metrology and Inspection for Practical Applications IX : 27 April - 8 May 2020, Online Only, United States /

Corporate Authors: Dimensional Optical Metrology and Inspection for Practical Applications Conference Online Only, United States; SPIE Society
Group Author: Harding, Kevin G; Zhang, Song
Published: SPIE,
Publication Dates: [2020]
Call Number: TB96-532/D582/2020

Book

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