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ASTM Committee E-24 on Fracture Testing
American Society for Testing and Materials.,Committee E-24 on Fracture Testing of Metals
SpringerLink (Online service)
Colegio 24 hs
Institute of Electrical and Electronics Engineers
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NetLibrary, Inc
ASTM Committee E-9 on Fatigue
IEEE Electron Devices Society
International Navigation Congress,Leningrad
IEEE Computer Society

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1
Powder diffraction file, sets 23 to 24

Cover is for reference only
Corporate Authors: JCPDS--International Centre for Diffraction Data
Published: The Centre,
Publication Dates: c1983.
Call Number: O72-62/P881/org./set.23-24/
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2
Optical biopsy VI 24 January 2006, San Jose, California, USA

Cover is for reference only
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Katz Alvin; Alfano Robert R 1941-
Published: SPIE,
Publication Dates: c2006.
Call Number: Q-336/O62.2/2006
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4
Optical biopsy X 24-25 January 2012, San Francisco, California, USA

Cover is for reference only
Corporate Authors: SPIE Society; Hamamatsu Corporation
Group Author: Alfano Robert R 1941-; Demos Stavros G
Published: SPIE,
Publication Dates: c2012.
Call Number: Q-336/O62.2/2012
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5
Silicon photonics III: 21-24 January 2008, San Jose, California, USA

Cover is for reference only
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Reed Graham T; Kubby Joel A
Published: SPIE,
Publication Dates: c2008.
Call Number: TN204-532/S583-2/2008
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7
Silicon photonics V 24-27 January 2010, San Francisco, California, United States

Cover is for reference only
Corporate Authors: SPIE Society
Group Author: Reed Graham T; Kubby Joel A
Published: SPIE,
Publication Dates: c2010.
Call Number: TN204-532/S583-2/2010
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11
Gallium nitride materials and devices III 21-24 January 2008, San Jose, California, USA

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Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Morkoç Hadis
Published: SPIE,
Publication Dates: c2008.
Call Number: TN304.2-532/G171-3/2008
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18
Quantum sensing and nanophotonic devices VII 24-28 January 2010, San Francisco, California, United States

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Corporate Authors: SPIE Society
Group Author: Sudharsanan Rengarajan; Brown Gail J; Razeghi M
Published: SPIE,
Publication Dates: c2010.
Call Number: TN201-532/Q18-2/2010
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