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1

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2022 IEEE International Instrumentation and Measurement Technology Conference : (I2MTC 2022) : Ottawa, Ontario, Canada, 16-19 May 2022.

Corporate Authors: IEEE International Instrumentation and Measurement Technology Conference Ottawa, Ontario, Canada); Institute of Electrical and Electronics Engineers.
Published: IEEE,
Publication Dates: [2022]
Call Number: TM93-532/I59/2022

Book

2

Cover is for reference only

Real-time Measurements, Rogue Phenomena, and Single-Shot Applications VII : 22-27 January 2022, San Francisco, California, United States ; 20-24 February 2022, Online /

Corporate Authors: Real-time Measurements, Rogue Phenomena, and Single-shot Applications San Francisco, California, United States ; Online); SPIE (Society)
Group Author: Solli, Daniel R.; Herink, Georg; Bielawski, Serge
Published: SPIE,
Publication Dates: [2022]
Call Number: N2-532/R288-1/2022

Book

3

Cover is for reference only

2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2021) : virtual conference, 17-20 May 2021.

Corporate Authors: IEEE International Instrumentation and Measurement Technology Conference Online); Institute of Electrical and Electronics Engineers.; IEEE Instrumentation and Measurement Society
Published: IEEE,
Publication Dates: [2021]
Call Number: TM93-532/I59/2021

Book

4

Cover is for reference only

Real-time Photonic Measurements, Data Management, and Processing VI : 10-12 October 2021, Nantong, China /

Corporate Authors: Real-time Photonic Measurements, Data Management, and Processing Nantong, China); SPIE (Society); Zhongguo guang xue xue hui
Group Author: Li, Ming; Jalali, B.; Mohammad Hossein Asghari
Published: SPIE,
Publication Dates: [2021]
Call Number: O43-532/R288/2021

Book

5

Cover is for reference only

Real-time Measurements, Rogue Phenomena, and Single-Shot Applications VI : 6-11 March 2021, Online Only, United States /

Corporate Authors: Real-time Measurements, Rogue Phenomena, and Single-shot Applications Online Only, United States); SPIE (Society)
Group Author: Solli, Daniel R.; Herink, Georg; Bielawski, Serge
Published: SPIE,
Publication Dates: [2021]
Call Number: N2-532/R288-1/2021

Book

6

Cover is for reference only

Tenth International Symposium on Precision Mechanical Measurements : 15-17 October 2021, Qingdao, China /

Corporate Authors: International Symposium on Precision Mechanical Measurements Qingdao, China); SPIE (Society)
Group Author: Xia, Haojie; Yang, Lian X.; Yu, Liandong
Published: SPIE,
Publication Dates: [2021]
Call Number: O432.2-532/I617/2021

Book

7

Cover is for reference only

Broadband UV-, VIS-, and IR-radiometric, photometric, color, and temperature measurements /

Main Authors: Eppeldauer, George P.
Published: Cambridge Scholars Publisher,
Publication Dates: 2021.
Call Number: TN915.142/E644

Book

8

Cover is for reference only

Real-time photonic measurements, data management, and processing V : 11-16 October 2020, Online only, China /

Corporate Authors: Real-time Photonic Measurements, Data Management, and Processing (Conference) Online only, China); Zhongguo guang xue xue hui; SPIE (Society); Qing hua da xue (Beijing, China); Zhongguo ke xue ji shu xie hui.; Guo jia zi ran ke xue ji jin wei yuan hui (China)
Group Author: Li, Ming; Jalali, B.; Mohammad Hossein Asghari
Published: SPIE,
Publication Dates: [2020]
Call Number: O43-532/R288/2020

Book

9

Cover is for reference only

2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2020) : Dubrovnik, Croatia, 25-28 May 2020.

Corporate Authors: IEEE International Instrumentation and Measurement Technology Conference Dubrovnik, Croatia); Institute of Electrical and Electronics Engineers.
Published: IEEE,
Publication Dates: [2020]
Call Number: TM93-532/I59/2020

Book

10

Cover is for reference only

Real-time Measurements, Rogue Phenomena, and Single-Shot Applications V : 4 February 2020, San Francisco, California, United States /

Corporate Authors: Real-time Measurements, Rogue Phenomena, and Single-shot Applications San Francisco, California, United States; SPIE Society
Group Author: Solli, Daniel R; Herink, Georg; Bielawski, Serge
Published: SPIE,
Publication Dates: [2020]
Call Number: N2-532/R288-1/2020

Book

11

Cover is for reference only

Particle physics reference library.

Group Author: Myers, Stephe; Fabjan, Christian W.; Schopper, Herwig
Published: SpringerOpen,
Publication Dates: 2020.
Call Number: O572.2/P273-1

Book

12

Cover is for reference only

Real-time Measurements, Rogue Phenomena, and Single-Shot Applications IV : 5-6 February 2019, San Francisco, California, United States /

Corporate Authors: Real-time Measurements, Rogue Phenomena, and Single-shot Applications Conference San Francisco, California, United States; SPIE Society
Group Author: Solli, Daniel R; Herink, Georg; Bielawski, Serge
Published: SPIE,
Publication Dates: [2019]
Call Number: N2-532/R288-1/2019

Book

13

Cover is for reference only

Tenth International Symposium on Precision Engineering Measurements and Instrumentation : 8-10 August 2018, Kun ming, China /

Corporate Authors: International Symposium on Precision Engineering Measurements and Instrumentation Kun ming, China; SPIE Society
Group Author: Tan, J. Jiubin; Lin, Jie
Published: SPIE,
Publication Dates: [2019]
Call Number: TH113.2-532/I617/2018

Book

14

Cover is for reference only

2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2019) : Auckland, New Zealand, 20-23, May 2019.

Corporate Authors: IEEE International Instrumentation and Measurement Technology Conference Auckland, New Zealand; IEEE Instrumentation and Measurement Society; Institute of Electrical and Electronics Engineers
Published: IEEE,
Publication Dates: [2019]
Call Number: TM93-532/I59/2019

Book

15

Cover is for reference only

Precision measurements to test the standard model and for explosive nuclear astrophysics /

Main Authors: Valverde, Adrian A
Published: Springer International Publishing,
Publication Dates: [2019]
Call Number: O571/V215

Book

16

Cover is for reference only

Ninth International Symposium on Precision Mechanical Measurements : 18-21 October 2019, Chongqing, China /

Corporate Authors: International Symposium on Precision Mechanical Measurements Chongqing, China; SPIE Society
Group Author: Yu, Liandong
Published: SPIE,
Publication Dates: [2019]
Call Number: O432.2-532/I617/2019

Book

17

Cover is for reference only

Real-time photonic measurements, data management, and processing IV : 22-23 October 2019, Hangzhou, China /

Corporate Authors: Zhongguo guang xue xue hui; SPIE Society; Qing hua da xue Beijing, China; Zhongguo ke xue ji shu xie hui; Guo jia zi ran ke xue ji jin wei yuan hui China
Group Author: Li, Ming; Jalali, B; Mohammad Hossein Asghari
Published: SPIE,
Publication Dates: [2019]
Call Number: O43-532/R288/2019

Book

18

Cover is for reference only

Norm /

Main Authors: Liang, Sylvia
Published: Thames & Hudson,
Publication Dates: [2019]
Call Number: I561.85/L693-1

Book

19

Cover is for reference only

Real-time measurements, rogue phenomena, and single-shot applications III : 29-30 January 2018, San Francisco, California, United States /

Corporate Authors: Real-time Measurements, Rogue Phenomena, and Single-shot Applications San Francisco, California, United States; SPIE Society
Group Author: Jalali, B; Solli, Daniel R; Steinmeyer, Gunter
Published: SPIE,
Publication Dates: [2018]
Call Number: TN2-532/R288-1/2018

Book

20

Cover is for reference only

Measurement and data analysis for engineering and science /

Main Authors: Dunn, Patrick F
Group Author: Davis, Michael P
Published: Taylor & Francis, CRC Press,
Publication Dates: 2018.
Call Number: O4-34/D923/4th ed.

Book

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