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1
Semiconductor measurement technology techniques for measuring the integrity of passivation overcoats on integrated circuits

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Main Authors: Kern Werner 1925- (Werner Kern and Robert B. Comizzoli ; RCA Laboratories.)
Corporate Authors: Radio Corporation of America. RCA Laboratories Division; United States. National Bureau of Standards; United States. Defense Advanced Research Projects Agency
Group Author: Comizzoli Robert B (jt. auth.)
Published: Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
Publication Dates: 1977.
Call Number: TN43/N277/
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2
Nondestructive tests used to insure the integrity of semiconductor devices with emphasis on acoustic emission techniques /

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Main Authors: Harman, George G
Corporate Authors: United States. Defense Advanced Research Projects Agency
Published: U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off.,
Publication Dates: 1979.
Call Number: TN304.07/H287
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3
Measurement evaluation

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Main Authors: Mandel John. 1914-
Group Author: Nanni L. F.; (Luis F.)
Published: U.S. Dept. of Commerce, National Bureau of Standards For sale by the Supt. of Docs., U.S. G.P.O.,
Publication Dates: [1986]
Call Number: TB9-56/M271
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