馆藏书目查询系统 - 上海图书馆

1

Cover is for reference only

2004 ROCS Workshop：proceedings : October 24, 2004, Monterey, California

Corporate Authors: ROCS Workshop (2004 Monterey, Calif; JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards; IEEE Electron Devices Society
Published: JEDEC,
Publication Dates: [c2004].
Call Number: TN304.2-532/R382/2004

Book

2

Cover is for reference only

Optical network engineering and integrity：24-25 October 1995, Philadelphia, Pennsylvania

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Paul Dilip K; Greenwell Roger A; Yuce Hakan H
Published: SPIE,
Publication Dates: c1996.
Call Number: TN929.1-532/O62.1/1995/

Book

3

Cover is for reference only

Reliability, testing, and characterization of MEMS/MOEMS：22-24 October 2001, San Francisco, USA

Corporate Authors: Semiconductor Equipment and Materials International; Society of Photo-Optical Instrumentation Engineers
Group Author: Ramesham Rajeshuni
Published: SPIE,
Publication Dates: c2001.
Call Number: TH-39/R382/2001

Book

4

Cover is for reference only

Testing, reliability, and applications of optoelectronic devices：24-26 January, 2001, San Jose, [California] USA

Group Author: Chin Aland K
Published: SPIE,
Publication Dates: c2001.
Call Number: TN203-532/T344/2001

Book

5

Cover is for reference only

The Sixteenth Symposium on Reliable Distributed Systems：proceedings : Durham, North Carolina, October 22-24, 1997

Corporate Authors: Symposium on Reliable Distributed Systems (16th 1997 Durham, N.C.); IEEE Computer Society. TC on Distributed Processing.; IEEE Computer Society. Fault-Tolerant Computing Technical Committee.; IEEE Computer Society. Technical Committee on Operating Systems.; Center for Advanced Computing and Communication.
Published: IEEE Computer Society,
Publication Dates: c1997.
Call Number: TP338.8-532/S989/1997/

Book

6

Cover is for reference only

The Sixth International Symposium on Software Reliability Engineering：proceedings, October 24-27, 1995, Toulouse, France

Corporate Authors: International Symposium on Software Reliability Engineering (1995 Toulouse, France; IEEE Reliability Society; IEEE Computer Society. Software Engineering Technical Committee
Published: IEEE Computer Society Press,
Publication Dates: c1995.
Call Number: TP311.5-532/I61.2/1995/

Book

7

Cover is for reference only

Reliability physics 1979：17th annual proceedings, San Francisco, California, April 24-26, 1979

Corporate Authors: International Reliability Physics Symposium (17th 1979 San Francisco, Calif; IEEE Electron Devices Society; IEEE Reliability Group
Published: The Society,
Publication Dates: c1979.
Call Number: TN306-53/I59.1/1979/

Book

8

Cover is for reference only

17th annual proceedings: reliability physics - 1979, San Francisco, California, April 24-26, 1979.

Corporate Authors: Institute of Electrical and Electronics Engineers; International Reliability Physics Symposium
Published:
Call Number: TN306-532/R382/1979

Book

9

Cover is for reference only

Reliability, packaging, testing, and characterization of MEMS/MOEMS VI：23-24 January, 2007, San Jose, California, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Hartzell Allyson L; Ramesham Rajeshuni
Published: SPIE,
Publication Dates: c2007.
Call Number: TN406-532/R382/2007

Book

10

Cover is for reference only

Reliability, packaging, testing, and characterization of MEMS/MOEMS IV：24-25 January 2005, San Jose, California, USA

Corporate Authors: Solid State Technology Organization; Sandia National Laboratories; Society of Photo-Optical Instrumentation Engineers; Semiconductor Equipment and Materials International
Group Author: Tanner Danelle Mary 1952-; Ramesham Rajeshuni
Published: SPIE,
Publication Dates: c2005.
Call Number: TN406-532/R382/2005

Book

11

Cover is for reference only

Getting trains into service：International Railtech Congress '98 : 24-26 November 1998, National Exhibition Centre, Birmingham, UK

Corporate Authors: International Railtech Congress (1998 Birmingham, England; Institution of Mechanical Engineers Great Britain. Railway Division; Institution of Railway Signal Engineers Great Britain
Published: Professional Engineering Pub. for the Institution of Mechanical Engineers,
Publication Dates: 1998.
Call Number: TF610

Book

12

Cover is for reference only

Dependable computing：first Latin-American symposium, LADC 2003, São Paulo, Brazil, October 21-24, 2003 : proceedings

Corporate Authors: LADC 2003 (1st 2003 São Paulo, Brazil
Group Author: Lemos Rogério de 1961-; Weber Taisy Silva 1953-; Camargo João Batista 1958-
Published: Springer,
Publication Dates: c2003.
Call Number: TP33-532/D419/2003

Book

13

Cover is for reference only

2002 IEEE International Integrated Reliability Workshop：final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002

Corporate Authors: IEEE International Integrated Reliability Workshop (2002 Lake Tahoe, Calif; IEEE Electron Devices Society; IEEE Reliability Society
Published: IEEE Society,
Publication Dates: c2002.
Call Number: TN406-532/I61/2002

Book

14

Cover is for reference only

Computer safety, reliability, and security：24th international conference, SAFECOMP 2005, Fredrikstad, Norway, September 28-30, 2005 : proceedings

Corporate Authors: SAFECOMP 2005 (2005 Fredrikstad, Norway
Group Author: Winther Rune; Gran Bj2rn Axel; Dahll Gustav
Published: Springer,
Publication Dates: c2005.
Call Number: TP309-532/I61/2005

Book

15

Cover is for reference only

Computer safety, reliability, and security：23rd international conference, SAFECOMP 2004, Potsdam, Germany, September 21-24, 2004 : proceedings

Corporate Authors: SAFECOMP 2004 (2004 Potsdam, Germany
Group Author: Heisel Maritta; Liggesmeyer Peter; Wittmann Stefan
Published: Springer,
Publication Dates: 2004.
Call Number: TP309-532/I61/2004

Book

16

Cover is for reference only

Quality of future Internet services：Second COST 263 International Workshop, QofIS 2001, Coimbra, Portugal, September 24-26, 2001 : proceedings

Corporate Authors: COST 263 International Workshop (2nd 2001 Coimbra, Portugal
Group Author: Smirnov Mikhail I
Published: Springer,
Publication Dates: c2001.
Call Number: TP393.4-532/I618/2001

Book

17

Cover is for reference only

IET International Conference on Resilience of Transmission and Distribution Networks : (RTDN 2015) : Birmingham, United Kingdom, 22-24 September 2015.

Corporate Authors: IET International Conference on Resilience of Transmission and Distribution Networks Birmingham, United Kingdom
Published: Institution of Engineering and Technology,
Publication Dates: [2015]
Call Number: TM7-532/I596-1/2015

Book

18

Cover is for reference only

Computer safety, reliability, and security : 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedings /

Corporate Authors: SAFECOMP (Conference) Toulouse, France); SpringerLink (Online service)
Group Author: Bitsch, Friedemann; Guiochet, Jérémie; Kaâniche, Mohamed
Published: Springer,
Publication Dates: 2013.

eBook

19

Cover is for reference only

Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices XII：23-24 January 2012, San Francisco, California, United States

Corporate Authors: Vuzix Corporation; Fraunhofer-Institut fu r Zuverla ssigkeit und Mikrointegration; SPIE Society; Dyoptyka Firm
Group Author: Garcia-Blanco Sonia; Ramesham Rajeshuni
Published: SPIE,
Publication Dates: c2012.
Call Number: TN406-532/R382/2012

Book

20

Cover is for reference only

IET Conference on Reliability of Transmission and Distribution Networks 2011：(RTDN 2011), [proceedings], London, United Kingdom, 22-24 November 2011

Corporate Authors: Institution of Engineering and Technology Conference on Reliability of Transmission and Distribution Networks (2011 London, England; Institution of Engineering and Technology
Published: Institution of Engineering and Technology Printed from e-media with permission by Curran Associates, Inc.,
Publication Dates: 2012, c2011.
Call Number: TM732-532/I596/2011

Book

Narrow Search