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2008 IEEE International Conference on Microelectronic Test Structures：ICMTS : conference proceedings : March 24-27, The University of Edinburgh, UK

Corporate Authors: IEEE International Conference on Microelectronic Test Structures (21st 2008 University of Edinburgh, UK; IEEE Electron Devices Society; IEEE Xplore Online service
Published: IEEE,
Publication Dates: c2008.
Call Number: TN407-532/I61/2008

Book

82

Cover is for reference only

Twenty first IEEE/CPMT International Electronics Manufacturing Technology Symposium：October 13-15, 1997, Austin, TX USA

Corporate Authors: IEEE/CPMT International Electronics Manufacturing Technology Symposium (21st 1997 Austin, Tex; Semiconductor Equipment and Materials International; Components, Packaging & Manufacturing Technology Society
Published: IEEE,
Publication Dates: c1997.
Call Number: TN05-532/I59/1997/

Book

83

Cover is for reference only

Twenty First Annual IEEE Semiconductor Thermal Measurement and Management Symposium：proceedings 2005 : San Jose, CA, USA, March 15-17, 2005

Corporate Authors: IEEE Semiconductor Thermal Measurement and Management Symposium (21st 2005 San Jose, Calif; National Institute of Standards and Technology U.S; Components, Packaging & Manufacturing Technology Society
Published: IEEE,
Publication Dates: c2005.
Call Number: TN3-532/I59/2005

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