Reset Filters
Filter Related Topics: Semiconductors

Author Results for ２４

ASTM Committee E-24 on Fracture Testing
American Society for Testing and Materials.,Committee E-24 on Fracture Testing of Metals
SpringerLink (Online service)
Colegio 24 hs
Institute of Electrical and Electronics Engineers
see all »
NetLibrary, Inc
ASTM Committee E-9 on Fatigue
IEEE Electron Devices Society
International Navigation Congress,Leningrad
IEEE Computer Society

Filter Related Topics within your search.
Semiconductors Congresses 26 Integrated circuits 22 Design and construction 19 Materials 14 Defects 10 Optoelectronic devices 10 more ...
6
Optoelectronic integrated circuits IX 22-24 January 2007, San Jose, California, USA

Cover is for reference only
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Eldada Louay A; Lee El-Hang
Published: SPIE,
Publication Dates: c2007.
Call Number: TN491-532/O62/2007
Book
Save to List
Saved in:
7
Rapid thermal and laser processing 24-25 September 1992, San Jose, California

Cover is for reference only
Group Author: Muller Heinrich G.; Kwong Dim-Lee.
Published: SPIE,
Publication Dates: c1993.
Call Number: TN405-532/R218/1992/
Book
Save to List
Saved in:
9
Developments in semiconductor microlithography IV April 23-24, 1979, San Jose, California

Cover is for reference only
Corporate Authors: Northern California Microphotomask/Masking Working Group
Group Author: Dey Jim
Published: Society of Photo-optical Instrumentation Engineers,
Publication Dates: c1979.
Call Number: TS82-53/S678/1979/
Book
Save to List
Saved in:
12
Gallium nitride materials and devices III 21-24 January 2008, San Jose, California, USA

Cover is for reference only
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Morkoç Hadis
Published: SPIE,
Publication Dates: c2008.
Call Number: TN304.2-532/G171-3/2008
Book
Save to List
Saved in:
16
Advanced processing and characterization of semiconductors III 22-24 January 1986, Los Angeles, California

Cover is for reference only
Group Author: Sadana Devendra K; Current Michael I
Published: SPIE--the International Society for Optical Engineering,
Publication Dates: c1986.
Call Number: TN3-53/A244/1986/
Book
Save to List
Saved in:
17
Advanced etch technology for nanopatterning III : 24-25 February 2014, San Jose, California, United States /

Cover is for reference only
Corporate Authors: SPIE Society
Group Author: Oehrlein, Gottlieb S; Lin, Qinghuang, 1963
Published: SPIE,
Publication Dates: [2014]
Call Number: TB4-532/A244/2014
Book
Save to List
Saved in:
20
Nonlinear and electro-optic materials for optical switching 23-24 April 1992, Orlando, Florida

Cover is for reference only
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Soileau M. J
Published: The Society,
Publication Dates: c1992.
Call Number: TM564-532/N813/1992/
Book
Save to List
Saved in:
Search Tools: Get RSS Feed — Email this Search —