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1
Semiconductor measurement technology : progress report, October 1, 1976 to March 31, 1977 /

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Corporate Authors: United States. National Bureau of Standards
Group Author: Bullis, W. Murray, 1930
Published: U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off.,
Publication Dates: 1979.
Call Number: TN3/S471-5
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Semiconductor measurement technology : spreading resistance analysis for silicon layers with nonuniform resistivity /

Cover is for reference only
Main Authors: Dickey, David H
Group Author: Ehrstein, James R
Published: U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O.,
Publication Dates: 1979.
Call Number: TN304.07/D551
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3
Semiconductor measurement technology : spreading resistance analysis for silicon layers with nonuniform resistivity /

Cover is for reference only
Main Authors: Dickey, David H
Group Author: Ehrstein, James R
Published: U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O.,
Publication Dates: 1979.
Call Number: TN3/D551
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6
MFPG product durability and life proceedings on the 27th meeting of the Mechanical Failures Prevention Group, held at the National Bureau of Standards, Gaithersburg, Maryland, November 1-3, 1977

Cover is for reference only
Corporate Authors: Mechanical Failures Prevention Group; United States. Institute for Materials Research
Group Author: Shives T Robert; Willard William A
Published: Dept. of Commerce, National Bureau of Standards, National Measurement Laboratory : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
Publication Dates: 1978.
Call Number: TH16-53/M486-1/1977/
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8
Validation, verification, and testing of computer software /

Cover is for reference only
Main Authors: Adrion, W. Richards
Corporate Authors: United States. National Bureau of Standards; Center for Programming Science and Technology Institute for Computer Sciences and Technology
Group Author: Branstad, Martha A; Cherniavsky, John C
Published: U.S. Dept. of Commerce, National Bureau of Standards : For sale by Supt. of Docs., U.S. G.P.O.,
Publication Dates: 1981.
Call Number: TP31/A243
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9
NBS minimal BASIC test programs : version 2, user's manual /

Cover is for reference only
Main Authors: Cugini, John V
Corporate Authors: Center for Programming Science and Technology Institute for Computer Sciences and Technology; United States. National Bureau of Standards
Group Author: Bowden, Joan S; Skall, Mark
Published: U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O.,
Publication Dates: 1980.
Call Number: TP312/C965
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12
NBS FORTRAN test programs

Cover is for reference only
Main Authors: Holberton Frances E. ([by] Frances E. Holberton and Elizabeth G. Parker.)
Corporate Authors: United States. National Bureau of Standards.
Group Author: Parker Elizabeth G. (joint author.)
Published: National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.]
Publication Dates: 1974.
Call Number: TP31/U58/
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13
Semiconductor measurement technology techniques for measuring the integrity of passivation overcoats on integrated circuits

Cover is for reference only
Main Authors: Kern Werner 1925- (Werner Kern and Robert B. Comizzoli ; RCA Laboratories.)
Corporate Authors: Radio Corporation of America. RCA Laboratories Division; United States. National Bureau of Standards; United States. Defense Advanced Research Projects Agency
Group Author: Comizzoli Robert B (jt. auth.)
Published: Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
Publication Dates: 1977.
Call Number: TN43/N277/
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14
Software validation, verification, and testing technique and tool reference guide

Cover is for reference only
Corporate Authors: Center for Programming Science and Technology Institute for Computer Sciences and Technology
Group Author: Powell Patricia B
Published: U.S. Dept. of Commerce, National Bureau of Standards For sale by the Supt. of Docs., U.S. G.P.O.,
Publication Dates: 1982.
Call Number: TP31/S681
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16
Structured testing a software testing methodology using the cyclomatic complexity metric

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Main Authors: McCabe Thomas J 1941-
Corporate Authors: McCabe & Associates; United States. National Bureau of Standards
Published: U.S. Dept. of Commerce, National Bureau of Standards For sale by the Supt. of Docs., U.S. G.P.O.,
Publication Dates: 1982.
Call Number: TP31/M121
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17
Planning for software validation, verification, and testing

Cover is for reference only
Corporate Authors: Center for Programming Science and Technology Institute for Computer Sciences and Technology
Published: U.S. Dept. of Commerce, National Bureau of Standards For sale by the Supt. of Docs., U.S. G.P.O.,
Publication Dates: 1982.
Call Number: TP31/P712
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19
Graphical solution for the helium leak detector and radioisotope methods of hermetic test master graphs and instructions

Cover is for reference only
Main Authors: Ruthberg Stanley
Corporate Authors: Center for Electronics and Electrical Engineering U.S
Published: U.S. Dept. of Commerce, National Bureau of Standards For sale by the Supt. of Docs., U.S. G.P.O.,
Publication Dates: 1982.
Call Number: TN304.07/R974
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