Reset Filters
Filter Related Topics: Testing

Author Results for ２１

21世紀中国総研編
International Geological Congress
International Geological Congress,Norden
SpringerLink (Online service)
International Geological Congress,Copenhagen, Denmark
see all »
Sorgenfrei,Theodor
《21世纪经济报道》著
Institute of Electrical and Electronics Engineers
21世纪中国美术家编委会[编]
IEEE Electron Devices Society

Filter Related Topics within your search.
Testing Congresses 30 Materials 18 Design and construction 17 Integrated circuits 16 Semiconductors 9 Reliability 8 more ...
1
Seed health testing progress towards the 21st century

Cover is for reference only
Corporate Authors: International Seed Testing Association. Plant Disease Committee
Group Author: Hutchins J. D; John D; Reeves J. C; James C
Published: CAB International,
Publication Dates: c1997.
Call Number: S339.3-532/S451/1996
Book
Save to List
Saved in:
2
21st-century electronic projects for a new age

Cover is for reference only
Main Authors: Horn Delton T
Published: TAB Books,
Publication Dates: c1992.
Call Number: TN/H613/
Book
Save to List
Saved in:
4
2006 IEEE Autotestcon Anaheim, CA, 18-21September 2006.

Cover is for reference only
Corporate Authors: Autotestcon (2006 Anaheim, CA; IEEE Xplore Online service; Institute of Electrical and Electronics Engineers
Published: IEEE Operations Center,
Publication Dates: c2006.
Call Number: TP274-532/I59/2006
Book
Save to List
Saved in:
5
1978 annual book of ASTM standards. Part 21-24.

Cover is for reference only
Corporate Authors: American Society for Testing and Materials
Published: ASTM,
Publication Dates: c1978.
Call Number: T-657.12/A512/1978/
Book
Save to List
Saved in:
7
Microelectronics manufacturing and reliability 21-22 September 1992, San Jose, California

Cover is for reference only
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Vasquez Barbara
Published: SPIE,
Publication Dates: c1993.
Call Number: TN40-532/M626/1992/
Book
Save to List
Saved in:
8
Surface characterization and testing, 21-22 August 1986, San Diego, California

Cover is for reference only
Group Author: Creath Katherine.
Published: SPIE,
Publication Dates: c1987.
Call Number: TH74-53/S961/1986/
Book
Save to List
Saved in:
9
Bactroban (mupirocin) proceedings of an international symposium, Nassau, May 21-22, 1984

Cover is for reference only
Corporate Authors: International Symposium on Bactroban 1984 Nassau, Bahamas)
Group Author: Dobson Richard L
Published: Excerpta Medica Sole distributors for the USA and Canada, Elsevier Science Pub. Co.,
Publication Dates: 1985.
Call Number: R986-53/B131/
Book
Save to List
Saved in:
10
2007 IEEE International Test Conference Santa Clara, CA, 21-26 October 2007.

Cover is for reference only
Corporate Authors: International Test Conference (2007 Santa Clara, CA; IEEE Xplore Online service; Institute of Electrical and Electronics Engineers
Published: Institute of Electrical and Electronics Engineers,
Publication Dates: c2007.
Call Number: TN407-532/I594/2007
Book
Save to List
Saved in:
13
Test and measurement applications of optoelectronic devices 21-22 January, 2002, San Jose, USA

Cover is for reference only
Group Author: Chin Aland K
Published: SPIE,
Publication Dates: c2002.
Call Number: TN203-532/T342/2002
Book
Save to List
Saved in:
15
Spectroscopic characterization techniques for semiconductor technology II January 21-22, 1985, Los Angeles, California

Cover is for reference only
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Pollak Fred H
Published: SPIE--the International Society for Optical Engineering,
Publication Dates: c1985.
Call Number: TN3-53/S741/1985/
Book
Save to List
Saved in:
16
Model checking software : 28th International Symposium, SPIN 2022, virtual event, May 21, 2022, proceedings /

Cover is for reference only
Corporate Authors: International SPIN Workshop Online)
Group Author: Legunsen, Owolabi; Roşu, Grigore
Published: Springer,
Publication Dates: [2022]
Call Number: TP311.5-532/I617-1/2022
Book
Save to List
Saved in:
18
1996 2nd International Conference on ASIC proceedings, Shanghai, China, October 21-24, 1996

Cover is for reference only
Corporate Authors: International Conference on ASIC (2nd 1996 Shanghai; Chung-kuo tien tzu hs鑥eh hui
Group Author: Zhang Qian-Ling; Tang Ting-ao; Yu Huihua
Published: Shanghai Scientific and Technological Literature Pub. House,
Publication Dates: [1996]
Call Number: TN4-532/I61.5/1996/
Book
Save to List
Saved in:
Search Tools: Get RSS Feed — Email this Search —