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ASTM Committee E-24 on Fracture Testing
American Society for Testing and Materials.,Committee E-24 on Fracture Testing of Metals
SpringerLink (Online service)
Colegio 24 hs
Institute of Electrical and Electronics Engineers
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NetLibrary, Inc
ASTM Committee E-9 on Fatigue
IEEE Electron Devices Society
International Navigation Congress,Leningrad
IEEE Computer Society

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Testing Congresses 27 Design and construction 13 Materials 13 Reliability 10 Integrated circuits 7 Nondestructive testing 6 more ...
1
1978 annual book of ASTM standards. Part 21-24.

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Corporate Authors: American Society for Testing and Materials
Published: ASTM,
Publication Dates: c1978.
Call Number: T-657.12/A512/1978/
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2
PowerTest 2020 Conference : Chicago, Illinois, USA, 24-28 February 2020.

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Corporate Authors: PowerTest Conference Chicago, Illinois, USA); International Electrical Testing Association.
Published: Curran Associates, Inc.,
Publication Dates: [2020]
Call Number: TM7-532/P888/2020
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8
Proceedings of thermal imaging for refractory inspection and plant maintenance : June 24, 1975, Pittsburgh, Pennsylvania /

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Corporate Authors: American Gas Association
Group Author: Eklund, Jan K
Published: AGA,
Publication Dates: [1975?]
Call Number: TQ175.1-532/A512/1975
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9
Testing, reliability, and applications of optoelectronic devices 24-26 January, 2001, San Jose, [California] USA

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Group Author: Chin Aland K
Published: SPIE,
Publication Dates: c2001.
Call Number: TN203-532/T344/2001
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10
1996 2nd International Conference on ASIC proceedings, Shanghai, China, October 21-24, 1996

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Corporate Authors: International Conference on ASIC (2nd 1996 Shanghai; Chung-kuo tien tzu hs鑥eh hui
Group Author: Zhang Qian-Ling; Tang Ting-ao; Yu Huihua
Published: Shanghai Scientific and Technological Literature Pub. House,
Publication Dates: [1996]
Call Number: TN4-532/I61.5/1996/
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19
Sensing for agriculture and food quality and safety IV 24-25 April 2012, Baltimore, Maryland, United States

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Corporate Authors: SPIE Society
Group Author: TU Shu-I; Chao Kaunglin; Kim Moon S; Moon Sung
Published: SPIE,
Publication Dates: c2012.
Call Number: S127-532/S478/2012
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