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Testing Congresses 20 Materials 16 Design and construction 13 Integrated circuits 11 Non-destructive testing 9 Optical instruments 9 more ...
1
AUTOTESTCON 2005 Orlando, FL, 26-29 September 2005

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Corporate Authors: Autotestcon (2005 Orlando, Fla; Institute of Electrical and Electronics Engineers
Published: IEEE Operations Center,
Publication Dates: c2005.
Call Number: TP274-532/I59/2005
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4
2007 IEEE International Test Conference Santa Clara, CA, 21-26 October 2007.

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Corporate Authors: International Test Conference (2007 Santa Clara, CA; IEEE Xplore Online service; Institute of Electrical and Electronics Engineers
Published: Institute of Electrical and Electronics Engineers,
Publication Dates: c2007.
Call Number: TN407-532/I594/2007
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5
Optical manufacturing and testing X : 26-27 August 2013, San Diego, California, United States /

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Corporate Authors: SPIE Society
Group Author: Fähnle, Oliver W; Williamson, Ray; Kim, Dae Wook
Published: SPIE,
Publication Dates: [2013]
Call Number: O439-532/O624/2013
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8
Testing, reliability, and applications of optoelectronic devices 24-26 January, 2001, San Jose, [California] USA

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Group Author: Chin Aland K
Published: SPIE,
Publication Dates: c2001.
Call Number: TN203-532/T344/2001
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9
Reliability physics 1988 26th annual proceedings, Monterey, Ca., April 12-14, 1988

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Published: IEEE,
Publication Dates: c1988.
Call Number: TN306-53/I59.1/1988/
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13
Crack propagation in pipelines, Newcastle upon Tyne, England, 26th & 27th March 1974

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Corporate Authors: Institution of Gas Engineers, London; British Gas Corporation
Published: Institution of Gas Engineers,
Publication Dates: [1975]
Call Number: U178-53/B862/1974/
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14
26th Aerospace Testing Seminar 2011, Los Angeles, California, USA, 29-31 March 2011.

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Corporate Authors: Aerospace Testing Seminar (26th 2011 California, USA
Published: IEST,
Publication Dates: 2011.
Call Number: V448.25-532/A252/2011
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