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21
Transmission electron microscopy physics of image formation and microanalysis

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Main Authors: Reimer Ludwig 1928-
Published: Springer-Verlag,
Publication Dates: c1993.
Call Number: TN16/R363/3rd ed./
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22
Transmission electron microscopy physics of image formation and microanalysis

Cover is for reference only
Main Authors: Reimer Ludwig 1928-
Published: Springer-Verlag,
Publication Dates: c1989.
Call Number: TN153/R363/2nd ed./
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23
Basic techniques for transmission electron microscopy /

Cover is for reference only
Main Authors: Hayat, M. A., 1936-
Corporate Authors: Elsevier Science & Technology.
Published: Academic Press,
Publication Dates: 1986.
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24
Basic techniques for transmission electron microscopy

Cover is for reference only
Main Authors: Hayat M. A 1936-
Published: Academic Press,
Publication Dates: 1986.
Call Number: TN16/H413/
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25
Transmission electron microscopy physics of image formation and microanalysis

Cover is for reference only
Main Authors: Reimer Ludwig 1928-
Published: Springer-Verlag,
Publication Dates: 1984.
Call Number: TN153/R363/
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26
Experimental high-resolution electron microscopy

Cover is for reference only
Main Authors: Spence John C. H
Published: Clarendon Press Oxford University Press,
Publication Dates: 1980.
Call Number: TN153/S744/
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27
The chemical applications of transmission electron microscopy

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Main Authors: Fryer J. R
Published: Academic Press,
Publication Dates: 1979.
Call Number: O6-32/F948/
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28
Transmission electron microscopy of silicon VLSI circuits and structures

Cover is for reference only
Main Authors: Marcus R. B. (Robert B.)
Group Author: Sheng T. T.; (Tai Tsu)
Published: Wiley,
Publication Dates: c1983.
Call Number: TN47/M322/
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29
High-resolution imaging and spectrometry of materials

Cover is for reference only
Group Author: Ernst F.; (Frank), 1938-; Rühle Manfred.
Published: Springer,
Publication Dates: c2003.
Call Number: TB302/H638
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31
Specimen preparation for transmission electron microscopy of materials IV symposium held April 2, 1997, San Francisco, California, U.S.A.

Cover is for reference only
Group Author: (Ron M.); Walck Scott D.; Anderson R. M.
Published: Materials Research Society,
Publication Dates: c1997.
Call Number: TB303-532/S741/1997/
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32
Electron tomography methods for three-dimensional visualization of structures in the cell

Cover is for reference only
Group Author: Frank J.; (Joachim), 1940-
Published: Springer,
Publication Dates: [2006]
Call Number: Q-336/E38.2/2nd.ed.
Book
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33
Transmission electron microscopy physics of image formation

Cover is for reference only
Main Authors: Reimer Ludwig, 1928-
Corporate Authors: SpringerLink (Online service)
Group Author: Kohl H.; (Helmut)
Published: Springer,
Publication Dates: c2008.
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35
Material characterization using electron holography /

Cover is for reference only
Main Authors: Shindō, D. (Daisuke), 1953- (Author)
Group Author: Tomita, Takeshi
Published: Wiley-VCH,
Publication Dates: [2023]
Call Number: TB877/S556
Book
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36
In-situ transmission electron microscopy experiments : design and practice /

Cover is for reference only
Main Authors: Sharma, Renu (Author)
Published: Wiley-VCH,
Publication Dates: [2023]
Call Number: TN16/S531
Book
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37
Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists /

Cover is for reference only
Main Authors: Dong, ZhiLi (Author)
Published: CRC Press,
Publication Dates: 2022.
Call Number: O72/D682
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38
Advanced transmission electron microscopy : imaging and diffraction in nanoscience /

Cover is for reference only
Main Authors: Zuo, Jian Min (Author)
Group Author: Spence, John C. H.
Published: Springer,
Publication Dates: [2017]
Call Number: TB383/Z95
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39
Transmission electron microscopy and diffractometry of materials

Cover is for reference only
Main Authors: Fultz B. (Brent)
Corporate Authors: SpringerLink (Online service)
Group Author: Howe James M., 1955-
Published: Springer,
Publication Dates: c2008.
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