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1

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微系统光学检测技术

Main Authors: 德奥斯腾 ((德)Wolfgang Osten主编)
Published: 机械工业出版社
Publication Dates: 2014
Call Number: TB96/2847

Book

2

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Fringe 2005：the 5th International Workshop on Automatic Processing of Fringe Patterns

Corporate Authors: International Workshop on Automatic Processing of Fringe Patterns (5th 2005 Stuttgart, Germany)
Group Author: Osten Wolfgang.
Published: Springer,
Publication Dates: c2006.

Book

3

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Fringe 2005：the 5th International Workshop on Automatic Processing of Fringe Patterns

Corporate Authors: International Workshop on Automatic Processing of Fringe Patterns (5th 2005 Stuttgart, Germany
Group Author: Osten Wolfgang
Published: Springer,
Publication Dates: c2006.
Call Number: O436-53/I61/2005

Book

4

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Optical inspection of microsystems

Group Author: Osten Wolfgang
Published: CRC/Taylor & Francis,
Publication Dates: c2007.
Call Number: TB133/O626

Book

5

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Optical imaging and metrology：advanced technologies

Group Author: Osten Wolfgang (Editor); Reingand Nadya (Editor)
Published: Wiley-VCH John Wiley [distributor],
Publication Dates: c2012.
Call Number: TB96/O626

Book

6

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Fringe 2009：6th International Workshop on Advanced Optical Metrology

Corporate Authors: International Workshop on Advanced Optical Metrology (6th 2009 Nu rtingen, Germany); SpringerLink (Online service)
Group Author: Osten Wolfgang.; Kujawinska Ma¿gorzata.
Published: Springer,
Publication Dates: 2009.

Book

7

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Fringe '89：proceedings of the I. International Workshop on Automatic Processing of Fringe Patterns held in Berlin (GDR), April 25-28, 1989

Corporate Authors: International Workshop on Automatic Processing of Fringe Patterns (1st 1989 Berlin, Germany
Group Author: Osten Wolfgang
Published: Akademie-Verlag,
Publication Dates: 1989.
Call Number: O436-53/I61/1989/

Book

8

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Optical measurement systems for industrial inspection III：23-26 June 2003, Munich, Germany

Corporate Authors: European Optical Society; Wissenschaftliche Gesellschaft Lasertechnik; Society of Photo-Optical Instrumentation Engineers
Group Author: Creath Katherine; Kujawińska Małgorzata; Osten Wolfgang
Published: SPIE,
Publication Dates: c2003.
Call Number: TH74-532/O62.1/2003

Book

9

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Optical inspection of microsystems /

Group Author: Osten, Wolfgang
Published: CRC Press, Taylor & Francis Group,
Publication Dates: [2020]
Call Number: TB133/O626/2nd ed.

Book

10

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Interferometry XI：applications, 10-11 July 2002, Seattle USA

Corporate Authors: Boeing Company; Society of Photo-Optical Instrumentation Engineers
Group Author: Osten Wolfgang
Published: SPIE,
Publication Dates: c2002.
Call Number: TH744.3-532/I61/2002

Book

11

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Optical imaging and metrology advanced technologies /

Group Author: Osten, Wolfgang; Reingand, Nadya
Published:

Electronic eBook

12

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Optical measurement systems for industrial inspection：16-17 June 1999, Munich, Germany

Corporate Authors: Society of Photo-Optical Instrumentation Engineers; European Optical Society
Group Author: Osten Wolfgang; Kujawinska Malgorzata
Published: SPIE,
Publication Dates: c1999.
Call Number: TH74-532/O62.1/1999/

Book

13

2017 International Conference on Optical Instruments and Technology. 28-30 October 2017, Beijing, China /

Cover is for reference only

2017 International Conference on Optical Instruments and Technology. Optoelectronic imaging/spectroscopy and signal processing technology : 28-30 October 2017, Beijing, China /

Corporate Authors: International Conference on Optical Instruments and Technology Beijing, China; Zhongguo yi qi yi biao xue hui; SPIE Society
Group Author: Situ, Guohai; Cao, Xun; Osten, Wolfgang
Published: SPIE,
Publication Dates: [2018]
Call Number: TN27-532/I613-1/2017

Book

14

AOPC 2017. 4-6 June 2017, Beijing, China /

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AOPC 2017. 3D measurement technology for intelligent manufacturing : 4-6 June 2017, Beijing, China /

Corporate Authors: AOPC Conference Beijing, China; Chinese Society for Optical Engineering; Department of Cooperation and Coordination for Industry, Academe and Research, CHIA; Zhongguo yu hang xue hui; Science and Technology on Low-light-level Night Vision Laboratory; SPIE Society; Science and Technology on Electro-Optical Information Security Control Laboratory
Group Author: Asundi, Anand‏; Zhao, Huijie‏; Osten, Wolfgang‏
Published: SPIE,
Publication Dates: [2017]
Call Number: TH74-532/A652-2/2017

Book

15

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Optical micro- and nanometrology IV：16-18 April 2012, Brussels, Belgium

Corporate Authors: SPIE Society
Group Author: Osten Wolfgang; Gorecki Christophe; Asundi Anand
Published: SPIE,
Publication Dates: c2012.
Call Number: TB96-532/O626/2012

Book

16

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Optical micro- and nanometrology III：13-16 April 2010, Brussels, Belgium

Corporate Authors: B-PHOT--Brussels Photonics Team; Comité belge d'optique; SPIE Society
Group Author: Asundi Anand; Osten Wolfgang; Gorecki Christophe
Published: SPIE,
Publication Dates: c2010.
Call Number: TB96-532/O626/2010

Book

17

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Optical micro- and nanometrology in microsystems technology II：8-10 April 2008, Strasbourg, France

Corporate Authors: Alsace International; Association Française des Industries de l'Optique et de la Photonique; Society of Photo-Optical Instrumentation Engineers; SPIE Europe
Group Author: Asundi Anand; Osten Wolfgang; Gorecki Christophe
Published: SPIE,
Publication Dates: 2008.
Call Number: TB96-532/O626/2008

Book

18

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Optical measurement systems for industrial inspection V：18-22 June 2007, Munich, Germany

Corporate Authors: European Optical Society; Wissenschaftliche Gesellschaft Lasertechnik; Society of Photo-Optical Instrumentation Engineers; SPIE Europe
Group Author: Gorecki Christophe; Novak Erik; Osten Wolfgang
Published: SPIE,
Publication Dates: c2007.
Call Number: TH74-532/O62.1/2007

Book

19

Cover is for reference only

Interferometry XIII.. Applications：: 16-17 August, 2006, San Diego, California, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Osten Wolfgang; Gorecki Christophe; Novak Erik
Published: SPIE,
Publication Dates: c2006.
Call Number: O436.1-532/I61.1/2006/[2]

Book

20

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Optical micro- and nanometrology in microsystems technology：5-7 April 2006, Strasbourg, France

Corporate Authors: Bas-Rhin France. Conseil gaenaeral; Comitae national d'optique et de photonique France; Society of Photo-Optical Instrumentation Engineers; SPIE Europe
Group Author: Asundi Anand; Osten Wolfgang; Gorecki Christophe
Published: SPIE,
Publication Dates: 2006.
Call Number: TB96-532/O626-2/2006

Book

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