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61

Cover is for reference only

Microlithography and metrology in micromachining II：14-15 October, 1996, Austin, Texas

Corporate Authors: Semiconductor Equipment and Materials International; National Institute of Standards and Technology U.S; Society of Photo-Optical Instrumentation Engineers
Group Author: Friedrich Craig; Postek Michael T
Published: SPIE,
Publication Dates: c1996.
Call Number: TH11-532/M626.1/1996/

Book

62

Cover is for reference only

Micromachining and microfabrication process technology II：14-15 October 1996, Austin, Texas

Corporate Authors: Semiconductor Equipment and Materials International; National Institute of Standards and Technology U.S; Society of Photo-Optical Instrumentation Engineers
Group Author: Chang Shih-Chia; Pang Stella W
Published: SPIE--The International Society of Optical Engineering,
Publication Dates: c1996.
Call Number: TH11-532/M626.2/1996/

Book

63

Cover is for reference only

Microelectronic structures and microelectromechanical devices for optical processing and multimedia applications：24 October, 1995, Austin, Texas

Corporate Authors: National Institute of Standards and Technology U.S; Society of Photo-Optical Instrumentation Engineers; Semiconductor Equipment and Materials International
Group Author: Motamedi M. Edward; Luo Fang-Chen; Bailey Wayne E
Published: SPIE,
Publication Dates: c1995.
Call Number: TN403-532/M626/1995

Book

64

Cover is for reference only

Micromachined devices and components：23-24 October, 1995, Austin, Texas

Corporate Authors: Society of Photo-Optical Instrumentation Engineers; National Institute of Standards and Technology U.S; Semiconductor Equipment and Materials International
Group Author: Chau Kevin; Roop Ray
Published: SPIE,
Publication Dates: c1995.
Call Number: TH11-532/M626.3/1995

Book

65

Cover is for reference only

Micromachining and microfabrication process technology：23-24 October, 1995, Austin, Texas

Corporate Authors: National Institute of Standards and Technology U.S; Society of Photo-Optical Instrumentation Engineers; Semiconductor Equipment and Materials International
Group Author: Markus Karen W
Published: SPIE,
Publication Dates: c1995.
Call Number: TH11-532/M626.2/1995

Book

66

Cover is for reference only

Microlithography and metrology in micromachining：23-24 October, 1995, Austin, Texas

Corporate Authors: National Institute of Standards and Technology U.S; Society of Photo-Optical Instrumentation Engineers; Semiconductor Equipment and Materials Institute
Group Author: Postek Michael T
Published: SPIE,
Publication Dates: c1995.
Call Number: TH11-532/M626.1/1995

Book

67

Cover is for reference only

Nondestructive characterization for composite materials, aerospace engineering, civil infrastructure, and homeland security 2010：8-11 March 2010, San Diego, California, USA

Corporate Authors: American Society of Mechanical Engineers; Intelligent Materials Forum Mitō Kagaku Gijutsu Kyōkai; Jet Propulsion Laboratory U.S; National Science Foundation U.S; Society of Photo-Optical Instrumentation Engineers
Group Author: Shull Peter J 1957-; Diaz Aaron A; Wu H. Felix
Published: SPIE,
Publication Dates: c2010
Call Number: V25-532/N812/2010

Book

68

Cover is for reference only

Sensors and smart structures technologies for civil, mechanical, and aerospace systems 2008：10-13 March 2008, San Diego, California, USA

Corporate Authors: American Society of Mechanical Engineers; Intelligent Materials Forum Mitō Kagaku Gijutsu Kyōkai; Jet Propulsion Laboratory U.S; National Science Foundation U.S; Society of Photo-Optical Instrumentation Engineers
Group Author: Tomizuka M
Published: SPIE,
Publication Dates: c2008.
Call Number: TP212.9-532/S478/2008/pt.1

Book

69

Cover is for reference only

Behavior and mechanics of multifunctional and composite materials 2008：10-13 March 2008, San Diego, California, USA

Corporate Authors: American Society of Mechanical Engineers; Intelligent Materials Forum Mitō Kagaku Gijutsu Kyōkai; Jet Propulsion Laboratory U.S; National Science Foundation U.S; Society of Photo-Optical Instrumentation Engineers
Group Author: Ounaies Zoubeida; Dapino Marcelo J
Published: SPIE--The International Society for Optical Engineering,
Publication Dates: c2008.
Call Number: TB3-532/B419/2008

Book

70

Cover is for reference only

Nondestructive characterization for composite materials, aerospace engineering, civil infrastructure, and homeland security 2008：11-13 March 2008, San Diego, California, USA

Corporate Authors: American Society of Mechanical Engineers; Intelligent Materials Forum Mitō Kagaku Gijutsu Kyōkai; Jet Propulsion Laboratory U.S; National Science Foundation U.S; Society of Photo-Optical Instrumentation Engineers
Group Author: Shull Peter J 1957-
Published: SPIE,
Publication Dates: c2008.
Call Number: V25-532/N812/2008

Book

71

Cover is for reference only

Nanosensors and microsensors for bio-systems 2008：11-13 March 2008, San Diego, California, USA

Corporate Authors: American Society of Mechanical Engineers; Intelligent Materials Forum Mitō Kagaku Gijutsu Kyōkai; Jet Propulsion Laboratory U.S; National Science Foundation U.S; Society of Photo-Optical Instrumentation Engineers
Group Author: Varadan V. K 1943-
Published: SPIE,
Publication Dates: c2008.
Call Number: TP212-532/N186/2008

Book

72

Cover is for reference only

Sensor systems and networks：phenomena, technology, and applications for NDE and health monitoring 2007 :19-21 March 2007, San Diego, California, USA

Corporate Authors: American Society of Mechanical Engineers; Intelligent Materials Forum Mitō Kagaku Gijutsu Kyōkai; Jet Propulsion Laboratory U.S; National Science Foundation U.S; Society of Photo-Optical Instrumentation Engineers
Group Author: Peters Kara J
Published: SPIE,
Publication Dates: c2007.
Call Number: TP72-532/S478/2007

Book

73

Cover is for reference only

Nondestructive characterization for composite materials, aerospace engineering, civil infrastructure and homeland security：20-22 March 2007, San Diego, California, USA

Corporate Authors: American Society of Mechanical Engineers; Intelligent Materials Forum Mitō Kagaku Gijutsu Kyōkai; Jet Propulsion Laboratory U.S; National Science Foundation U.S; Society of Photo-Optical Instrumentation Engineers
Group Author: Diaz Aaron A; Shull Peter J 1957-; Wu H. Felix
Published: SPIE,
Publication Dates: c2007.
Call Number: V25-532/N812/2007

Book

74

Cover is for reference only

Senors and smart structures technologies for civil, mechanical ,and aerospace systems 2007：19-22 March, 2007, San Diego, California, USA

Corporate Authors: American Society of Mechanical Engineers; Intelligent Materials Forum Mitō Kagaku Gijutsu Kyōkai; Jet Propulsion Laboratory U.S; National Science Foundation U.S; Society of Photo-Optical Instrumentation Engineers
Group Author: Yun Chung-Bang; Giurgiutiu Victor; Tomizuka M
Published: SPIE,
Publication Dates: c2007.
Call Number: TP18-532/S478/2007

Book

75

Cover is for reference only

Nondestructive evaluation and health monitoring of aerospace materials, composites, and civil infrastructure V：28 February-2 March 2006, San Diego, California, USA

Corporate Authors: Intelligent Materials Forum Mitō Kagaku Gijutsu Kyōkai; American Society of Mechanical Engineers; Jet Propulsion Laboratory U.S; National Science Foundation U.S; Society of Photo-Optical Instrumentation Engineers
Group Author: Gyekenyesi Andrew L; Shull Peter J 1957-; Mufti Aftab A
Published: SPIE,
Publication Dates: c2006.
Call Number: V250.2-532/N812/2006

Book

76

Cover is for reference only

Smart structures and materials 2006.. Sensors and smart structures, technologies for civil, mechanical, and aerospace systems：27 February-2 March, 2006, San Diego, California, USA

Corporate Authors: American Society of Mechanical Engineers; Intelligent Materials Forum Mitō Kagaku Gijutsu Kyōkai; Jet Propulsion Laboratory U.S; National Science Foundation U.S; Society of Photo-Optical Instrumentation Engineers
Group Author: Yun Chung-Bang; Giurgiutiu Victor; Tomizuka M
Published: SPIE,
Publication Dates: c2006.
Call Number: TP212.14-532/S636/2006

Book

77

Cover is for reference only

Testing, reliability, and application of micro- and nano-material systems IV：28 February-2 March 2006, San Diego, California, USA

Corporate Authors: American Society of Mechanical Engineers; Intelligent Materials Forum Mitō Kagaku Gijutsu Kyōkai; Jet Propulsion Laboratory U.S; National Science Foundation U.S; Society of Photo-Optical Instrumentation Engineers
Group Author: Geer Robert E
Published: SPIE,
Publication Dates: c2006.
Call Number: TN204-532/T344/2006

Book

78

Cover is for reference only

Smart structures and materials 2006.. Active materials: behavior and mechanics：27 February-2 March, 2006, San Diego, California, USA

Corporate Authors: American Society of Mechanical Engineers; Intelligent Materials Forum Mitō Kagaku Gijutsu Kyōkai; Jet Propulsion Laboratory U.S; National Science Foundation U.S; Society of Photo-Optical Instrumentation Engineers
Group Author: Armstrong William D
Published: SPIE,
Publication Dates: c2006.
Call Number: TP204-532/S636/2006

Book

79

Cover is for reference only

Nanostructure science, metrology, and technology：5-7 September 2001, Gaithersburg, USA

Corporate Authors: National Institute of Standards and Technology U.S; United States. Office of Naval Research; Society of Photo-Optical Instrumentation Engineers
Group Author: Postek Michael T; Peckerar Martin Charles 1946-
Published: SPIE-the International Society for Optical Engineering,
Publication Dates: c2002.
Call Number: TB4-532/N186/2001

Book

80

Cover is for reference only

International Conference on Experimental mechanics：advances and applications : proceedings : 4-6 December, 1996, Singapore

Corporate Authors: International Conference on Experimental Mechanics : Advances and Applications (1996 Singapore; Society for Experimental Mechanics U.S; Society of Photo-optical Instrumentation Engineers. Singapore Chapter; University of Singapore. Dept. of Mechanical and Production Engineering; Society of Photo-Optical Instrumentation Engineers
Group Author: Chau F. S; Lim C. T
Published: SPIE,
Publication Dates: c1997.
Call Number: O3-532/I61.1/1996/

Book

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