Author Results for Wu, Cheng-Wen, EE Ph. D

Elsevier Science & Technology
Wang,Laung-Terng
Wen,Xiaoqing
Wu,Cheng-Wen,
edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

1
VLSI test principles and architectures design for testability

Cover is for reference only
Group Author: Wang Laung-Terng; Wu Cheng-Wen, EE Ph. D; Wen Xiaoqing
Published: Elsevier Morgan Kaufmann Publishers,
Publication Dates: c2006.
Call Number: TN47/V871
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2
VLSI test principles and architectures : design for testability /

Cover is for reference only
Corporate Authors: Elsevier Science & Technology.
Group Author: Wang, Laung-Terng. (Editor); Wu, Cheng-Wen, EE Ph. D. (Editor); Wen, Xiaoqing (Editor)
Published: Elsevier Morgan Kaufmann Publishers,
Publication Dates: 2006.
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