1
Fundamentals of surface and thin film analysis

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Main Authors: Feldman Leonard C.
Published: North-Holland,
Publication Dates: c1986.
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2
Thin film processing and characterization of high-temperature superconductors, Anaheim, CA, 1987

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Group Author: Harper James M. E.; Colton Richard J.; Feldman Leonard C.
Published: American Institute of Physics,
Publication Dates: 1988.
Call Number: Q511-53/T443/1987/
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3
Materials analysis by ion channeling submicron crystallography

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Main Authors: Feldman Leonard C.
Group Author: Mayer James W., 1930-; Picraux S. T., 1943-
Published: Academic Press,
Publication Dates: 1982.
Call Number: Tb302.1/F312/
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4
Fundamentals of nanoscale film analysis

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Main Authors: Alford Terry L.
Corporate Authors: SpringerLink (Online service)
Group Author: Mayer James W., 1930-; Feldman Leonard C.
Published: Springer,
Publication Dates: c2007.
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