1
Discrete semiconductor reliability transistor/diode data

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Main Authors: Walker Roy C (prepared by Roy C. Walker, David B. Nicholls, Reliability Analysis Center (IIT Research Institute).)
Corporate Authors: IIT Research Institute; Reliability Analysis Center U.S
Group Author: Nicholls David B (joint author.)
Published: Reliability Analysis Center, Rome Air Development Center,
Publication Dates: 1977.
Call Number: TN32/R382/
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2
The altered landscape : photographs of a changing environment /

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Corporate Authors: Nevada Museum of Art
Group Author: Wolfe, Ann M.; Walker, David B.; Lippard, Lucy R.; Manaugh, Geoff; Mitchell, W. J. T. (William John Thomas), 1942-
Published: Skira Rizzoli Publications, Inc.,
Publication Dates: 2011.
Call Number: J434/A466
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3
Late harvest : 2014 Art + Environment Conference /

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Corporate Authors: Art + Environment Conference Nevada Museum of Art) (Author); Nevada Museum of Art; Center for Art + Environment
Group Author: Northrup, JoAnne (Curator); Harris, Adam Duncan (Curator); Anthenaise, Claude d' (Curator); Fox, William L. (Curator); Bryndís Snæbjörnsdóttir (Curator); Wilson, Mark, 1954- (Curator); Sterling, Bruce. (Curator); Walker, David B. (Curator); Bartlett, Brad (Designer); Abel, David (Editor)
Published: Hirmer ; Nevada Museum of Art, Donald W. Reynolds Center for the Visual Arts, E.L. Wiegand Gallery,
Publication Dates: [2014]
Call Number: J114-28/A784
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