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1

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2001 IEEE International Workshop on Memory Technology, Design, and Testing：proceedings : August 6-7, 2001, San Jose, California

Corporate Authors: IEEE International Workshop on Memory Technology, Design, and Testing (9th 2001 San Jose, Calif; IEEE Computer Society. Technical Committee on VLSI; IEEE Computer Society. Technical Council on Test Technology; IEEE Solid-State Circuits Society; IEEE Computer Society
Group Author: Zorian Yervant
Published: IEEE Computer Society,
Publication Dates: c2001.
Call Number: TP333.5-532/I59.1/2001

Book

2

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Embedded processor-based self-test

Main Authors: Gizopoulos Dimitris
Group Author: Paschalis Antonis; Zorian Yervant
Published: Kluwer Academic Publishers,
Publication Dates: c2004.
Call Number: TN707/G539

Book

3

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电子系统测试原理 = Principles of testing electronic systems

Main Authors: 美 Mourad Samiha ((美)Samiha Mourad，(美)Yervant Zorian著); 美 Zorian Yervant
Group Author: 张威 (译); 王仲 (译)
Published: 机械工业出版社
Publication Dates: 2007
Call Number: TN06/4813

Book

4

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Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing：(MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France

Corporate Authors: IEEE International Workshop on Memory Technology, Design and Testing (10th 2002 Isle of Bendor, France); IEEE Computer Society; IEEE Computer Society. Technical Committee on VLSI.; IEEE Computer Society. Technical Council on Test Technology.; IEEE Solid-State Circuits Society.
Group Author: Courtois B.; (Bernard); Wik T.; (Thomas); Zorian Yervant.
Published: IEEE Computer Society,
Publication Dates: c2002.
Call Number: TP333.5-532/I59.1/2002

Book

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