Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing：(MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France

Corporate Authors: IEEE International Workshop on Memory Technology, Design and Testing (10th 2002 Isle of Bendor, France); IEEE Computer Society; IEEE Computer Society. Technical Committee on VLSI.; IEEE Computer Society. Technical Council on Test Technology.; IEEE Solid-State Circuits Society.
Group Author: Courtois B.; (Bernard); Wik T.; (Thomas); Zorian Yervant.
Published: IEEE Computer Society,
Publication Dates: c2002.
Call Number: TP333.5-532/I59.1/2002