Cover is for reference only

Statistical approach to VLSI

Saved in:
Bibliographic Details
Group Author: Director Stephen W; Maly W
Published: North-Holland,
Publisher Address: Amsterdam
Publication Dates: 1994.
Literature type: Book
Language: English
Series: Advances in CAD for VLSI ; v. 8
Subjects:
Integrated circuits > Very large scale integration > Defects
Integrated circuits > Very large scale integration > Design and construction > Statistical methods
Mathematical optimization
Carrier Form: x, 391 p.: ill. ; 25 cm.
ISBN: 0444883711
Index Number: TN47
CLC: TN47-39
Call Number: TN47-39/S797/
Contents: Includes bibliographical references and index.

Related Book Recommendations