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International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997：13-15 May 1997, Kiev, Ukraine

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Bibliographic Details
Corporate Authors: International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics (1997 Kiev, Ukraine); Ukrainian Physical Society.; Society of Photo-Optical Instrumentation Engineers; SPIE Ukraine Chapter.
Group Author: Valakh M. I︠A︡.; (Mikhail I︠A︡kovlevich); Svechnikov Sergeĭ Vasilʹevich.
Published: SPIE,
Publisher Address: Bellingham, Wash., USA
Publication Dates: c1998.
Literature type: Book
Language: English
Series: SPIE proceedings series ; v. 3359
Subjects:
Electronics > Congresses. > Congresses. > Congresses.
Optoelectronics > Congresses. > Congresses. > Congresses.
Microelectronics > Congresses. > Congresses. > Congresses.
Quantum electronics > Congresses. > Congresses. > Congresses.
Carrier Form: xiii, 564 p.: ill. ; 28 cm.
ISBN: 0819428086
Index Number: TN20
CLC: TN20-532
TN04-532
TN40-532
Call Number: TN20-532/I61/1997/
Contents: Includes bibliographical references and index.

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