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XV international conference on electron microscopy : selected, peer reviewed papers presented at the XV International Conference on Electron Microscopy EM2014, 15-18 September 2014, Kraków, Poland /

"The scope of EM2014 conference was focused on modern electron microscopy methods applied mainly to materials science, physics, chemistry, earth and life science"--P.[v].

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Bibliographic Details
Corporate Authors: International Conference on Electron Microscopy Kraków, Poland; AGH University of Science and Technology; Polish Society for Microscopy; Committee of Materials Science of the Polish Academy of Sciences
Group Author: Dubiel, Beata (Editor); Moskalewicz, Tomasz (Editor)
Published: Trans Tech Publications Ltd,
Publisher Address: Pfaffikon, Switzerland :
Publication Dates: [2015]
Literature type: Book
Language: English
Series: Diffusion and defect data. Pt. B, Solid state phenomena
Subjects:
Electron microscopy > Congresses
Summary: "The scope of EM2014 conference was focused on modern electron microscopy methods applied mainly to materials science, physics, chemistry, earth and life science"--P.[v].
Carrier Form: xii, 156 pages : illustrations; 24 cm.
Bibliography: Includes bibliographical references and indexes.
ISBN: 9783038354680 (paperback) :
3038354686 (paperback)
Index Number: QD906
CLC: TN16-532
Call Number: TN16-532/I612/2014

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