XV international conference on electron microscopy : selected, peer reviewed papers presented at the XV International Conference on Electron Microscopy EM2014, 15-18 September 2014, Kraków, Poland /
"The scope of EM2014 conference was focused on modern electron microscopy methods applied mainly to materials science, physics, chemistry, earth and life science"--P.[v].
Saved in:
Corporate Authors: | ; ; ; |
---|---|
Group Author: | ; |
Published: |
Trans Tech Publications Ltd,
|
Publisher Address: | Pfaffikon, Switzerland : |
Publication Dates: | [2015] |
Literature type: | Book |
Language: | English |
Series: |
Diffusion and defect data. Pt. B, Solid state phenomena |
Subjects: | |
Summary: |
"The scope of EM2014 conference was focused on modern electron microscopy methods applied mainly to materials science, physics, chemistry, earth and life science"--P.[v]. |
Carrier Form: | xii, 156 pages : illustrations; 24 cm. |
Bibliography: | Includes bibliographical references and indexes. |
ISBN: |
9783038354680 (paperback) : 3038354686 (paperback) |
Index Number: | QD906 |
CLC: | TN16-532 |
Call Number: | TN16-532/I612/2014 |