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2007 IEEE International Test Conference：Santa Clara, CA, 21-26 October 2007.

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Bibliographic Details
Corporate Authors: International Test Conference (2007 Santa Clara, CA; IEEE Xplore Online service; Institute of Electrical and Electronics Engineers
Published: Institute of Electrical and Electronics Engineers,
Publisher Address: Piscataway, N.J.
Publication Dates: c2007.
Literature type: Book
Language: English
Subjects:
Semiconductors > Testing
Electronics
Integrated circuits > Testing
Carrier Form: 2 v.: ill. ; 28 cm.
ISBN: 1424411270
Index Number: TN306
CLC: TN306-532
TN407-532
TN307-532
Call Number: TN407-532/I594/2007
Contents: Includes bibliographical references and index.

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