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Gettering and defect engineering in semiconductor technology XII：Gadest 2007 ; proceedings of the 12th International Autumn Meeting, EMFCSC, Erice, Italy, October 14-19, 2007

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Bibliographic Details
Corporate Authors: International Autumn Meeting "Gettering and Defect Engineering in Semiconductor Technology" (12th 2007 Erice, Italy)
Group Author: Cavallini A.; (Anna)
Published: Trans Tech Publications,
Publisher Address: Stafa-Zurich, Switzerland
Publication Dates: c2008.
Literature type: Book
Language: English
Series: Diffusion and defect data. Pt. B, Solid state phenomena, ; v. 131-133
Subjects:
Semiconductors
Getters
Silicon crystals > Defects
Electrical engineering > Materials
Carrier Form: xv, 642 p.: ill. ; 25 cm.
ISBN: 9783908451433
3908451434
Index Number: TN3
CLC: TN3-532
Call Number: TN3-532/G394/2007
Contents: Includes bibliographical references and index.

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