Reset Filters
Author: 《优选家装设计典范》编写组编

Cover is for reference only

Scientific detection of fakery in art：29-30 January 1998, San Jose, California

Saved in:
Bibliographic Details
Corporate Authors: IS & T--the Society for Imaging Science and Technology.; Society of Photo-Optical Instrumentation Engineers
Group Author: Chartier Duane R.; Weiss Richard J.; (Richard Jerome), 1923-; McCrone Walter.
Published: SPIE,
Publisher Address: Bellingham, Wash., USA
Publication Dates: c1998.
Literature type: Book
Language: English
Series: SPIE proceedings series ; v. 3315
Subjects:
Art > Forgeries > Congresses.
Art > Expertising > Congresses.
Painting > Expertising > Congresses.
Expertising, X-ray > Congresses.
Science and the arts > Congresses.
Art > Radiography > Congresses.
Carrier Form: v, 106 p.: ill. ; 28 cm.
ISBN: 0819427551
Index Number: K854
CLC: K854.2-532
Call Number: K854.2-532/S416/1998/
Contents: Includes bibliographical references and index.

Related Book Recommendations