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1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems：proceedings : November 1-3, 1999, Albuquerque, New Mexico

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Bibliographic Details
Corporate Authors: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1999 Albuquerque, N. M; IEEE Computer Society; IEEE Computer Society. Fault-Tolerant Computing Technical Committee; IEEE Computer Society. Test Technology Technical Committee
Published: IEEE Computer Society Press,
Publisher Address: Los Alamitos, California
Publication Dates: c1999.
Literature type: Book
Language: English
Subjects:
Integrated circuits > Very large scale integration > Design and construction
Fault-tolerant computing
Carrier Form: xiii, 405 p.: ill. ; 23 cm.
ISBN: 076950325X
0769503276 (microfiche)
Index Number: TN470
CLC: TN470.9-532
TP302.8-532
Call Number: TP302.8-532/I59/1999/
Contents: "IEEE Computer Society Press Order Number PR00325"-verso of T.p.
Includes bibliographical references and author index.

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