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2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems：proceedings : 24-26 October, 2001, San Francisco, California

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Bibliographic Details
Corporate Authors: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2001 San Francisco, Calif; IEEE Computer Society. Fault-Tolerant Computing Technical Committee; IEEE Computer Society. Test Technology Technical Committee
Published: IEEE Computer Society Press,
Publisher Address: Los Alamitos, Calif.
Publication Dates: c2001.
Literature type: Book
Language: English
Subjects:
Integrated circuits > Very large scale integration > Design and construction
Fault-tolerant computing
Carrier Form: xiii, 468 p.: ill. ; 23 cm.
Publication Frequency: Also available via the World Wide Web.
ISBN: 0769512038
Index Number: TN470
CLC: TN470.9-532
TP302.8-532
Call Number: TP302.8-532/I59/2001
Contents: "IEEE Computer Society Order Number PR01203"--T.p. verso.
Includes bibliographical references and author index.

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