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Hot-carrier reliability of MOS VLSI circuits

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Bibliographic Details
Main Authors: Leblebici Yusuf
Group Author: Kang Sung-Mo 1945-
Published: Kluwer Academic,
Publisher Address: Boston
Publication Dates: c1993.
Literature type: Book
Language: English
Series: The Kluwer international series in engineering and computer science ; SECS 227.
Subjects:
Integrated circuits
Metal oxide semiconductors > Reliability > Mathematical models
Hot carriers > Reliability > Mathematical models
Integrated circuits > Very large scale integration > Defects > Mathematical models
Carrier Form: xvi, 212 p.: ill. ; 25 cm.
ISBN: 079239352X
Index Number: TN470
CLC: TN470.6
Call Number: TN470.6/L445/
Contents: Includes bibliographical references and index.

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