2017 International Conference on Optical Instruments and Technology. Optoelectronic measurement technology and systems : 28-30 October 2017, Beijing, China /
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Corporate Authors: | ; ; |
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Group Author: | ; ; ; |
Published: |
SPIE,
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Publisher Address: | Bellingham, Washington : |
Publication Dates: | [2018] |
Literature type: | Book |
Language: | English |
Series: |
Proceedings of SPIE,
volume 10621 |
Subjects: | |
Carrier Form: | 1 volume (various pagings) : illustrations ; 28 cm. |
Bibliography: | Includes bibliographical references. |
ISBN: | 9781510617537 (paperback) : |
CLC: | TH74-532 |
Call Number: | TH74-532/I613-7/2017 |