Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th birthday /

Saved in:
Bibliographic Details
Group Author: Nakamura, Syouji; Qian, Cun Hua; Chen, Mingchih
Published: World Scientific Pub. Co.,
Publisher Address: Singapore ; Hackensack, N.J. :
Publication Dates: [2014]
Literature type: Book
Language: English
Subjects:
Carrier Form: xiv, 364 pages : illustrations ; 24 cm
Bibliography: Includes bibliographical references.
ISBN: 9789814571937 (hardback) :
9814571938
Index Number: TA169
CLC: TB114.3
Call Number: TB114.3/R382-2