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International Symposium on Photoelectronic Detection and Imaging 2009.. Material and device technology for sensors：17-19 June 2009, Beijing China

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Bibliographic Details
Corporate Authors: International Symposium on Photoelectronic Detection and Imaging (2009 Beijing, China; Zhongguo yu hang xue hui. Photoelectric Technology Professional Committee; SPIE Society; China Aerospace Science and Industry Corporation. Tianjin Jinhang Institute of Technical Physics
Group Author: Chen Xu-yuan
Published: SPIE,
Publisher Address: Bellingham, Wash.
Publication Dates: c2009.
Literature type: Book
Language: English
Series: Proceedings of SPIE ; v. 7381
Subjects:
Optical detectors
Optical fiber detectors
Optoelectronic devices
Detectors > Materials
Carrier Form: 1 v. (various pagings): ill. ; 28 cm.
ISBN: 9780819476623
0819476625
Index Number: TN911
CLC: TN911.73-532
TN29-532
Call Number: TN29-532/I617-1/2009
Contents: Includes bibliographical references and author index.

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