Optical Metrology and Inspection for Industrial Applications VII : 11-16 October 2020, Online only, China /
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Corporate Authors: | ; ; ; ; ; |
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Group Author: | ; ; |
Published: |
SPIE,
|
Publisher Address: | Bellingham, Washington : |
Publication Dates: | [2020] |
Literature type: | Book |
Language: | English |
Series: |
Proceedings of SPIE,
volume 11552 |
Subjects: | |
Item Description: | "SPIE/COS photonics Asia"--Cover. |
Carrier Form: | 1 volume (various pagings) : illustrations ; 28 cm. |
Bibliography: | Includes bibliographical references. |
ISBN: | 9781510639195 |
CLC: |
TB133-532 TB96-532 |
Call Number: | TB96-532/O626-4/2020 |