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Optical Metrology and Inspection for Industrial Applications VII : 11-16 October 2020, Online only, China /

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Bibliographic Details
Corporate Authors: Optical Metrology and Inspection for Industrial Applications (Conference) Online only, China); SPIE (Society) (sponsoring body,); Zhongguo guang xue xue hui (sponsoring body.); Qing hua da xue (Beijing, China)‏ (cooperating organization.); Guo jia zi ran ke xue ji jin wei yuan hui (China)‏ (supporting organization.); Zhongguo ke xue ji shu xie hui‏ (supporting organization.)
Group Author: Han, Sen (Editor); Ehret, Gerd (Editor); Chen, Benyong (Editor)
Published: SPIE,
Publisher Address: Bellingham, Washington :
Publication Dates: [2020]
Literature type: Book
Language: English
Series: Proceedings of SPIE--the International Society for Optical Engineering ; volume 11552. 0277-786X
Subjects:
Engineering inspection > Congresses.
Optical detectors > Industrial applications > Congresses.
Optical measurements > Congresses.
Interferometry > Industrial applications > Congresses.
Quality control > Optical methods > Congresses.
Item Description: "SPIE/COS photonics Asia"--Cover.
Carrier Form: 1 volume (various pagings) : illustrations ; 28 cm.
Bibliography: Includes bibliographical references.
ISBN: 9781510639195
CLC: TB133-532
TB96-532
Call Number: TB96-532/O626-4/2020

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