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Characterization of very high speed semiconductor devices and integrated circuits

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Bibliographic Details
Corporate Authors: Metallurgical Society U.S; Society of Photo-Optical Instrumentation Engineers
Group Author: Jain Ravi
Published: SPIE,
Publisher Address: Bellingham, Wash., USA
Publication Dates: c1987.
Literature type: Book
Language: English
Series: Critical reviews of optical science and technology ; v. 795
Subjects:
Semiconductors > Congresses
Very high speed integrated circuits > Congresses
Carrier Form: x, 359 p.: ill. ; 28 cm.
ISBN: 0892528303
Index Number: TN40
CLC: TN40-532
Call Number: TN40-53/C469/1987/
Contents: Papers from a conference held Mar. 23-25, 1987, at Bay Point, Fla.
Includes bibliographies and index.

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