Characterization of very high speed semiconductor devices and integrated circuits
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Corporate Authors: | ; |
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Group Author: | |
Published: |
SPIE,
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Publisher Address: | Bellingham, Wash., USA |
Publication Dates: | c1987. |
Literature type: | Book |
Language: | English |
Series: |
Critical reviews of optical science and technology ; v. 795 |
Subjects: | |
Carrier Form: | x, 359 p.: ill. ; 28 cm. |
ISBN: | 0892528303 |
Index Number: | TN40 |
CLC: | TN40-532 |
Call Number: | TN40-53/C469/1987/ |
Contents: |
Papers from a conference held Mar. 23-25, 1987, at Bay Point, Fla. Includes bibliographies and index. |