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Automated optical inspection for industry：theory, technology, and applications II : 16-19 September, 1998, Beijing, China

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Bibliographic Details
Corporate Authors: Chung-kuo kuang hs鑥eh hs鑥eh hui; Kuo chia tzu jan k皁 hs鑥eh chi chin wei y鑥an hui China; Society of Photo-Optical Instrumentation Engineers
Group Author: Yeh Sheng-hua 1934-
Published: SPIE,
Publisher Address: Bellingham, Washington
Publication Dates: c1998.
Literature type: Book
Language: English
Series: Proceedings / SPIE--the International Society for Optical Engineering ; v. 3558
Subjects:
Quality control > Optical methods > Automation > Congresses
Optical detectors > Industrial applications > Congresses
Optical measurements > Congresses
Engineering inspection > Automation > Congresses
Carrier Form: xiii, 656 p.: ill. ; 28 cm.
ISBN: 0819430196
Index Number: TP277
CLC: TP277-532
Call Number: TP277-532/A939/1998/
Contents: Includes bibliographical references and author index.

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