Scientific detection of fakery in art II:20-21 September 1999, Boston, Massachusetts

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Bibliographic Details
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: McCrone Walter C.; Weiss Richard J.; (Richard Jerome), 1923-; Chartier Duane R.
Published: SPIE,
Publisher Address: Bellingham, Wash., USA
Publication Dates: c2000.
Literature type: Book
Language: English
Series: SPIE proceedings series ; v. 3851
Subjects:
Carrier Form: v, 82 p.: ill. ; 28 cm.
ISBN: 0819434442
Index Number: K854
CLC: K854.2-532
Call Number: K854.2-532/S416/1999
Contents: Includes bibliographical references and index.