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Scanning microscopies 2015 : 29 September-1 October 2015, Monterey, California, United States /

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceeding...

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Bibliographic Details
Corporate Authors: SPIE Society
Group Author: Postek, Michael T; Newbury, Dale E; Platek, S. Frank; Maugel, Tim K
Published: SPIE,
Publisher Address: Bellingham, Washington :
Publication Dates: [2015]
Literature type: Book
Language: English
Series: Proceedings of SPIE, volume 9636
Subjects:
Scanning electron microscopes > Congresses
Summary: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Carrier Form: 1 volume (various pagings) : illustrations ; 29 cm.
Bibliography: Includes bibliographical references.
ISBN: 9781628418460 :
162841846X
Index Number: QH212
CLC: TN16-532
Call Number: TN16-532/S283-3/2015

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