Optical measurement technology and instrumentation : 9-11 May 2016, Beijing, China /

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Bibliographic Details
Corporate Authors: SPIE Society
Group Author: Han, Sen; Tan, J. Jiubin
Published: SPIE,
Publisher Address: Bellingham, Washington :
Publication Dates: [2016]
Literature type: Book
Language: English
Series: Proceedings of SPIE, volume 10155
Subjects:
Carrier Form: 2 volumes : illustrations ; 28 cm.
Bibliography: Includes bibliographical references and author index.
ISBN: 9781510607682 (set) :
1510607684 (set)
9781510607699 (electronic)
1510607692 (electronic)
CLC: TH74-532
Call Number: TH74-532/O626-4/2016