Reliability physics, 1976:14th annual proceedings, Las Vegas, Nevada, April 20-22, 1976

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Bibliographic Details
Corporate Authors: International Reliability Physics Symposium (14th 1976 Las Vegas, Nev; IEEE Electron Devices Society; IEEE Reliability Group
Published: Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers,
Publisher Address: New York
Publication Dates: c1976.
Literature type: Book
Language: English
Subjects:
Carrier Form: vii, 309 p.: ill. ; 29 cm.
Index Number: TN306
CLC: TN306-532
Call Number: TN306-53/I59.1/1976/
Contents: Cover title: IEEE 1976 Reliability Physics Symposium.
Includes bibliographical references.