1995 IEEE International Reliability Physics proceedings:33rd annual : Las Vegas, Nevada : April 4, 5, 6, 1995

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Bibliographic Details
Corporate Authors: International Reliability Physics Symposium (33rd 1995 Las Vegas, Nev; IEEE Reliability Society; IEEE Electronic Devices Society
Published: IEEE,
Publisher Address: Piscataway, N.J.
Publication Dates: c1995.
Literature type: Book
Language: English
Subjects:
Carrier Form: vii, 405 p.: ill. ; 28 cm.
Publication Frequency: Also available via the World Wide Web with additional title: Reliability Physics Symposium, 1995, 33rd annual proceedings, IEEE International.
ISBN: 078032031X (softbound ed.)
0780320328 (casebound ed.)
0780320336 (microfiche ed.)
Index Number: TN306
CLC: TN306-532
Call Number: TN306-53/I59.1/1995
Contents: "IEEE catalog no. 95CH3471-0."
Includes bibliographical references.